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Title: Observation of amorphous to crystalline phase transformation in Te substituted Sn-Sb-Se thin films

Abstract

Thin films of Sn-Sb-Se-Te (8 ≤ x ≤ 14) chalcogenide system were prepared by thermal evaporation technique using melt quenched bulk samples. The as-prepared thin films were found amorphous as evidenced from X-ray diffraction studies. Resistivity measurement showed an exponential decrease with temperature upto critical temperature (transition temperature) beyond which a sharp decrease was observed and with further increase in temperature showed an exponential decrease in resistivity with different activation energy. The transition temperature showed a decreasing trend with tellurium content in the sample. The resistivity measurement during cooling run showed no abrupt change in resistivity. The resistivity measurements of annealed films did not show any abrupt change revealing the structural transformation occurring in the material. The transition width showed an increase with tellurium content in the sample. The resistivity ratio showed two order of magnitude improvements for sample with higher tellurium content. The observed transition temperature in this system was found quite less than already commercialized Ge-Sb-Te system for optical and electronic memories.

Authors:
 [1]
  1. Government Polytechnic College, Amritsar (India)
Publication Date:
OSTI Identifier:
22391745
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1661; Journal Issue: 1; Conference: ICCMP 2014: International Conference on Condensed Matter Physics 2014, Shimla (India), 4-6 Nov 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ACTIVATION ENERGY; AMORPHOUS STATE; ANNEALING; ANTIMONIDES; CRITICAL TEMPERATURE; ELECTRIC CONDUCTIVITY; EVAPORATION; TELLURIUM; TEMPERATURE DEPENDENCE; THIN FILMS; TIN SELENIDES; TIN TELLURIDES; X-RAY DIFFRACTION

Citation Formats

Chander, Ravi, E-mail: rcohri@yahoo.com. Observation of amorphous to crystalline phase transformation in Te substituted Sn-Sb-Se thin films. United States: N. p., 2015. Web. doi:10.1063/1.4915426.
Chander, Ravi, E-mail: rcohri@yahoo.com. Observation of amorphous to crystalline phase transformation in Te substituted Sn-Sb-Se thin films. United States. doi:10.1063/1.4915426.
Chander, Ravi, E-mail: rcohri@yahoo.com. Fri . "Observation of amorphous to crystalline phase transformation in Te substituted Sn-Sb-Se thin films". United States. doi:10.1063/1.4915426.
@article{osti_22391745,
title = {Observation of amorphous to crystalline phase transformation in Te substituted Sn-Sb-Se thin films},
author = {Chander, Ravi, E-mail: rcohri@yahoo.com},
abstractNote = {Thin films of Sn-Sb-Se-Te (8 ≤ x ≤ 14) chalcogenide system were prepared by thermal evaporation technique using melt quenched bulk samples. The as-prepared thin films were found amorphous as evidenced from X-ray diffraction studies. Resistivity measurement showed an exponential decrease with temperature upto critical temperature (transition temperature) beyond which a sharp decrease was observed and with further increase in temperature showed an exponential decrease in resistivity with different activation energy. The transition temperature showed a decreasing trend with tellurium content in the sample. The resistivity measurement during cooling run showed no abrupt change in resistivity. The resistivity measurements of annealed films did not show any abrupt change revealing the structural transformation occurring in the material. The transition width showed an increase with tellurium content in the sample. The resistivity ratio showed two order of magnitude improvements for sample with higher tellurium content. The observed transition temperature in this system was found quite less than already commercialized Ge-Sb-Te system for optical and electronic memories.},
doi = {10.1063/1.4915426},
journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1661,
place = {United States},
year = {2015},
month = {5}
}