Influence of Ag doping concentration on structural and optical properties of CdS thin film

Journal Article · Fri May 15 00:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4915408· OSTI ID:22391728

Kumar, Pragati ^[1]; Saxena, Nupur; Gupta, Vinay ^[2]; Agarwal, Avinash ^[1]

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1. Department of Physics, Bareilly College, Bareilly, 243 005, Uttar Pradesh (India)
2. Department of Physics and Astrophysics, University of Delhi, Delhi, 110 007 (India)

This work shows the influence of Ag concentration on structural properties of pulsed laser deposited nanocrystalline CdS thin film. X-ray photoelectron spectroscopy (XPS) studies confirm the dopant concentration in CdS films and atomic concentration of elements. XPS studies show that the samples are slightly sulfur deficient. GAXRD scan reveals the structural phase transformation from cubic to hexagonal phase of CdS without appearance of any phase of CdO, Ag{sub 2}O or Ag{sub 2}S suggesting the substitutional doping of Ag ions. Photoluminescence studies illustrate that emission intensity increases with increase in dopant concentration upto 5% and then decreases for higher dopant concentration.

• OSTI ID: 22391728
• Journal Information: AIP Conference Proceedings, Vol. 1661, Issue 1; Conference: ICCMP 2014: International Conference on Condensed Matter Physics 2014, Shimla (India), 4-6 Nov 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
77 NANOSCIENCE AND NANOTECHNOLOGY
CADMIUM OXIDES
CADMIUM SULFIDES
CONCENTRATION RATIO
CRYSTALS
CUBIC LATTICES
HEXAGONAL LATTICES
LASER RADIATION
NANOSTRUCTURES
OPTICAL PROPERTIES
PHASE TRANSFORMATIONS
PHOTOLUMINESCENCE
SILVER OXIDES
SILVER SULFIDES
THIN FILMS
X-RAY PHOTOELECTRON SPECTROSCOPY