Synthesis and characterization of ZnO nanostructured film for optoelectronic applications
Abstract
ZnO nanostructured film is synthesized by solution combustion technique. X-ray diffraction (XRD) studies show that preferred orientation is along (101) confirming the hexagonal wurtzite phase and no secondary phase is observed. The rietveld refinement of the XRD data was used to calculate different lattice parameters. I-V characterization of ZnO film shows non linear behavior. These ZnO films are photosensitive, may be due to defect states. This property of these films can be utilized in optoelectronic applications.
- Authors:
-
- Punjab Institute of Technology, Mohali-140501 (India)
- SUSCET, Tangori/Punjab Technical University, Jalandhar (India)
- Department of Applied Science, PEC University of Technology, Chandigarh-160012 (India)
- Publication Date:
- OSTI Identifier:
- 22391722
- Resource Type:
- Journal Article
- Journal Name:
- AIP Conference Proceedings
- Additional Journal Information:
- Journal Volume: 1661; Journal Issue: 1; Conference: ICCMP 2014: International Conference on Condensed Matter Physics 2014, Shimla (India), 4-6 Nov 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 77 NANOSCIENCE AND NANOTECHNOLOGY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CUBIC LATTICES; ELECTRIC CONDUCTIVITY; GRAIN ORIENTATION; NANOSTRUCTURES; NONLINEAR PROBLEMS; PHOTOSENSITIVITY; SYNTHESIS; THIN FILMS; X-RAY DIFFRACTION; ZINC OXIDES
Citation Formats
Kumar, Vijay, Singh, Harpreetpal, and Kumar, Sanjeev. Synthesis and characterization of ZnO nanostructured film for optoelectronic applications. United States: N. p., 2015.
Web. doi:10.1063/1.4915401.
Kumar, Vijay, Singh, Harpreetpal, & Kumar, Sanjeev. Synthesis and characterization of ZnO nanostructured film for optoelectronic applications. United States. https://doi.org/10.1063/1.4915401
Kumar, Vijay, Singh, Harpreetpal, and Kumar, Sanjeev. 2015.
"Synthesis and characterization of ZnO nanostructured film for optoelectronic applications". United States. https://doi.org/10.1063/1.4915401.
@article{osti_22391722,
title = {Synthesis and characterization of ZnO nanostructured film for optoelectronic applications},
author = {Kumar, Vijay and Singh, Harpreetpal and Kumar, Sanjeev},
abstractNote = {ZnO nanostructured film is synthesized by solution combustion technique. X-ray diffraction (XRD) studies show that preferred orientation is along (101) confirming the hexagonal wurtzite phase and no secondary phase is observed. The rietveld refinement of the XRD data was used to calculate different lattice parameters. I-V characterization of ZnO film shows non linear behavior. These ZnO films are photosensitive, may be due to defect states. This property of these films can be utilized in optoelectronic applications.},
doi = {10.1063/1.4915401},
url = {https://www.osti.gov/biblio/22391722},
journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1661,
place = {United States},
year = {Fri May 15 00:00:00 EDT 2015},
month = {Fri May 15 00:00:00 EDT 2015}
}
Other availability
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.