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Title: Fast model of electron transport for radiographic spectrum simulation

Abstract

Correctly modeling the continuous photon spectrum of X-ray tubes requires detailed knowledge of the probability distribution of electron properties at the time of X-ray photon creation, in particular electron energy, depth within the target, and direction of movement. Semi-analytical X-ray spectrum models frequently assume a very simplified or even uniform distribution of electron direction. In the case of thick targets and small deviations from normal incidence this is a useful approximation. For thin targets or large deviations from normal incidence the correct distribution of electron directions becomes more important. As calculation speed is an important aspect of semi-analytical models compared to Monte Carlo simulations, fast evaluation of the distribution of electron properties is highly desirable. The approach presented here numerically evaluates the evolution of a discrete probability distribution of electron properties due to single electron scatter interactions within a plane target. This allows capturing the important aspects of the electron distribution while achieving runtimes of a few seconds up to a minute on a standard office PC.

Authors:
; ; ;  [1]
  1. BAM Federal Institute for Materials Research and Testing, Unter den Eichen 87, 12205 Berlin (Germany)
Publication Date:
OSTI Identifier:
22391257
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1650; Journal Issue: 1; Conference: 41. Annual Review of Progress in Quantitative Nondestructive Evaluation, Boise, ID (United States), 20-25 Jul 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; APPROXIMATIONS; CAPTURE; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; ELECTRONS; MATHEMATICAL MODELS; MONTE CARLO METHOD; PHOTONS; SCATTERING; X RADIATION; X-RAY SPECTRA; X-RAY TUBES

Citation Formats

Deresch, A., E-mail: Andreas.Deresch@bam.de, Bellon, C., E-mail: Andreas.Deresch@bam.de, Jaenisch, G.-R., E-mail: Andreas.Deresch@bam.de, and Ewert, U., E-mail: Andreas.Deresch@bam.de. Fast model of electron transport for radiographic spectrum simulation. United States: N. p., 2015. Web. doi:10.1063/1.4914656.
Deresch, A., E-mail: Andreas.Deresch@bam.de, Bellon, C., E-mail: Andreas.Deresch@bam.de, Jaenisch, G.-R., E-mail: Andreas.Deresch@bam.de, & Ewert, U., E-mail: Andreas.Deresch@bam.de. Fast model of electron transport for radiographic spectrum simulation. United States. doi:10.1063/1.4914656.
Deresch, A., E-mail: Andreas.Deresch@bam.de, Bellon, C., E-mail: Andreas.Deresch@bam.de, Jaenisch, G.-R., E-mail: Andreas.Deresch@bam.de, and Ewert, U., E-mail: Andreas.Deresch@bam.de. Tue . "Fast model of electron transport for radiographic spectrum simulation". United States. doi:10.1063/1.4914656.
@article{osti_22391257,
title = {Fast model of electron transport for radiographic spectrum simulation},
author = {Deresch, A., E-mail: Andreas.Deresch@bam.de and Bellon, C., E-mail: Andreas.Deresch@bam.de and Jaenisch, G.-R., E-mail: Andreas.Deresch@bam.de and Ewert, U., E-mail: Andreas.Deresch@bam.de},
abstractNote = {Correctly modeling the continuous photon spectrum of X-ray tubes requires detailed knowledge of the probability distribution of electron properties at the time of X-ray photon creation, in particular electron energy, depth within the target, and direction of movement. Semi-analytical X-ray spectrum models frequently assume a very simplified or even uniform distribution of electron direction. In the case of thick targets and small deviations from normal incidence this is a useful approximation. For thin targets or large deviations from normal incidence the correct distribution of electron directions becomes more important. As calculation speed is an important aspect of semi-analytical models compared to Monte Carlo simulations, fast evaluation of the distribution of electron properties is highly desirable. The approach presented here numerically evaluates the evolution of a discrete probability distribution of electron properties due to single electron scatter interactions within a plane target. This allows capturing the important aspects of the electron distribution while achieving runtimes of a few seconds up to a minute on a standard office PC.},
doi = {10.1063/1.4914656},
journal = {AIP Conference Proceedings},
number = 1,
volume = 1650,
place = {United States},
year = {Tue Mar 31 00:00:00 EDT 2015},
month = {Tue Mar 31 00:00:00 EDT 2015}
}