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Title: Identification of inversion domains in KTiOPO{sub 4}via resonant X-ray diffraction

Abstract

The identification and high-resolution mapping of the absolute crystallographic structure in multi-domain ferroelectric KTiOPO{sub 4} is achieved through a novel synchrotron X-ray diffraction method. On a single Bragg reflection, the intensity ratio in resonant diffraction below and above the Ti absorption K edge demonstrates a domain contrast up to a factor of ∼270, thus implementing a non-contact, non-destructive imaging technique with micrometre spatial resolution, applicable to samples of arbitrarily large dimensions. A novel method is presented for the identification of the absolute crystallographic structure in multi-domain polar materials such as ferroelectric KTiOPO{sub 4}. Resonant (or ‘anomalous’) X-ray diffraction spectra collected across the absorption K edge of Ti (4.966 keV) on a single Bragg reflection demonstrate a huge intensity ratio above and below the edge, providing a polar domain contrast of ∼270. This allows one to map the spatial domain distribution in a periodically inverted sample, with a resolution of ∼1 µm achieved with a microfocused beam. This non-contact, non-destructive technique is well suited for samples of large dimensions (in contrast with traditional resonant X-ray methods based on diffraction from Friedel pairs), and its potential is particularly relevant in the context of physical phenomena connected with an absence of inversion symmetry,more » which require characterization of the underlying absolute atomic structure (such as in the case of magnetoelectric coupling and multiferroics)« less

Authors:
 [1];  [2]; ;  [1]
  1. Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE (United Kingdom)
  2. Department of Physics, University of Warwick, Coventry, CV4 7AL (United Kingdom)
Publication Date:
OSTI Identifier:
22389065
Resource Type:
Journal Article
Journal Name:
Acta Crystallographica. Section A, Foundations and Advances (Online)
Additional Journal Information:
Journal Volume: 71; Journal Issue: Pt 4; Other Information: PMCID: PMC4487424; PMID: 25970297; PUBLISHER-ID: pc5051; OAI: oai:pubmedcentral.nih.gov:4487424; Copyright (c) Federica Fabrizi et al. 2015; This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 2053-2733
Country of Publication:
United Kingdom
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION; BEAMS; BRAGG REFLECTION; COUPLING; DISTRIBUTION; FERROELECTRIC MATERIALS; POTENTIALS; SPATIAL RESOLUTION; SPECTRA; SYMMETRY; SYNCHROTRON RADIATION; SYNCHROTRONS; X-RAY DIFFRACTION

Citation Formats

Fabrizi, Federica, E-mail: federica.fabrizi@diamond.ac.uk, Thomas, Pamela A., Nisbet, Gareth, and Collins, Stephen P. Identification of inversion domains in KTiOPO{sub 4}via resonant X-ray diffraction. United Kingdom: N. p., 2015. Web. doi:10.1107/S2053273315007238.
Fabrizi, Federica, E-mail: federica.fabrizi@diamond.ac.uk, Thomas, Pamela A., Nisbet, Gareth, & Collins, Stephen P. Identification of inversion domains in KTiOPO{sub 4}via resonant X-ray diffraction. United Kingdom. doi:10.1107/S2053273315007238.
Fabrizi, Federica, E-mail: federica.fabrizi@diamond.ac.uk, Thomas, Pamela A., Nisbet, Gareth, and Collins, Stephen P. Thu . "Identification of inversion domains in KTiOPO{sub 4}via resonant X-ray diffraction". United Kingdom. doi:10.1107/S2053273315007238.
@article{osti_22389065,
title = {Identification of inversion domains in KTiOPO{sub 4}via resonant X-ray diffraction},
author = {Fabrizi, Federica, E-mail: federica.fabrizi@diamond.ac.uk and Thomas, Pamela A. and Nisbet, Gareth and Collins, Stephen P.},
abstractNote = {The identification and high-resolution mapping of the absolute crystallographic structure in multi-domain ferroelectric KTiOPO{sub 4} is achieved through a novel synchrotron X-ray diffraction method. On a single Bragg reflection, the intensity ratio in resonant diffraction below and above the Ti absorption K edge demonstrates a domain contrast up to a factor of ∼270, thus implementing a non-contact, non-destructive imaging technique with micrometre spatial resolution, applicable to samples of arbitrarily large dimensions. A novel method is presented for the identification of the absolute crystallographic structure in multi-domain polar materials such as ferroelectric KTiOPO{sub 4}. Resonant (or ‘anomalous’) X-ray diffraction spectra collected across the absorption K edge of Ti (4.966 keV) on a single Bragg reflection demonstrate a huge intensity ratio above and below the edge, providing a polar domain contrast of ∼270. This allows one to map the spatial domain distribution in a periodically inverted sample, with a resolution of ∼1 µm achieved with a microfocused beam. This non-contact, non-destructive technique is well suited for samples of large dimensions (in contrast with traditional resonant X-ray methods based on diffraction from Friedel pairs), and its potential is particularly relevant in the context of physical phenomena connected with an absence of inversion symmetry, which require characterization of the underlying absolute atomic structure (such as in the case of magnetoelectric coupling and multiferroics)},
doi = {10.1107/S2053273315007238},
journal = {Acta Crystallographica. Section A, Foundations and Advances (Online)},
issn = {2053-2733},
number = Pt 4,
volume = 71,
place = {United Kingdom},
year = {2015},
month = {5}
}