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Title: Multiscale modeling and experimental validation for nanochannel depth control in atomic force microscopy-based nanofabrication

Abstract

Nanochannels are essential features of many microelectronic and biomedical devices. To date, the most commonly employed method to fabricate these nanochannels is atomic force microscopy (AFM). However, there is presently a very poor understanding on the fundamental principles underlying this process, which limits its reliability and controllability. In this study, we present a comprehensive multiscale model by incorporating strain gradient plasticity and strain gradient elasticity theories, which can predict nanochannel depths during AFM-based nanofabrication. The modeling results are directly verified with experiments performed on Cu and Pt substrates. As this model can also be extended to include many additional conditions, it has broad applicability in a wide range of AFM-based nanofabrication applications.

Authors:
; ; ; ;  [1]
  1. State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai 200240 (China)
Publication Date:
OSTI Identifier:
22314646
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 7; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ATOMIC FORCE MICROSCOPY; DEPTH; ELASTICITY; FABRICATION; NANOSTRUCTURES; PLASTICITY; SIMULATION; STRAINS; SUBSTRATES; VALIDATION

Citation Formats

Ren, Jiaqi, Liu, Pinkuan, E-mail: pkliu@sjtu.edu.cn, Zhu, Xiaobo, Zhang, Fan, and Chen, Guozhen. Multiscale modeling and experimental validation for nanochannel depth control in atomic force microscopy-based nanofabrication. United States: N. p., 2014. Web. doi:10.1063/1.4893184.
Ren, Jiaqi, Liu, Pinkuan, E-mail: pkliu@sjtu.edu.cn, Zhu, Xiaobo, Zhang, Fan, & Chen, Guozhen. Multiscale modeling and experimental validation for nanochannel depth control in atomic force microscopy-based nanofabrication. United States. doi:10.1063/1.4893184.
Ren, Jiaqi, Liu, Pinkuan, E-mail: pkliu@sjtu.edu.cn, Zhu, Xiaobo, Zhang, Fan, and Chen, Guozhen. Thu . "Multiscale modeling and experimental validation for nanochannel depth control in atomic force microscopy-based nanofabrication". United States. doi:10.1063/1.4893184.
@article{osti_22314646,
title = {Multiscale modeling and experimental validation for nanochannel depth control in atomic force microscopy-based nanofabrication},
author = {Ren, Jiaqi and Liu, Pinkuan, E-mail: pkliu@sjtu.edu.cn and Zhu, Xiaobo and Zhang, Fan and Chen, Guozhen},
abstractNote = {Nanochannels are essential features of many microelectronic and biomedical devices. To date, the most commonly employed method to fabricate these nanochannels is atomic force microscopy (AFM). However, there is presently a very poor understanding on the fundamental principles underlying this process, which limits its reliability and controllability. In this study, we present a comprehensive multiscale model by incorporating strain gradient plasticity and strain gradient elasticity theories, which can predict nanochannel depths during AFM-based nanofabrication. The modeling results are directly verified with experiments performed on Cu and Pt substrates. As this model can also be extended to include many additional conditions, it has broad applicability in a wide range of AFM-based nanofabrication applications.},
doi = {10.1063/1.4893184},
journal = {Journal of Applied Physics},
number = 7,
volume = 116,
place = {United States},
year = {Thu Aug 21 00:00:00 EDT 2014},
month = {Thu Aug 21 00:00:00 EDT 2014}
}