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Title: Note: Effect of photodiode aluminum cathode frame on spectral sensitivity in the soft x-ray energy band

Abstract

Silicon photodiodes used for soft x-ray detection typically have a thin metal electrode partially covering the active area of the photodiode, which subtly alters the spectral sensitivity of the photodiode. As a specific example, AXUV4BST photodiodes from International Radiation Detectors have a 1.0 μm thick aluminum frame covering 19% of the active area of the photodiode, which attenuates the measured x-ray signal below ∼6 keV. This effect has a small systematic impact on the electron temperature calculated from measurements of soft x-ray bremsstrahlung emission from a high-temperature plasma. Although the systematic error introduced by the aluminum frame is only a few percent in typical experimental conditions on the Madison Symmetric Torus, it may be more significant for other instruments that use similar detectors.

Authors:
; ; ;  [1];  [2]
  1. Department of Physics, University of Wisconsin–Madison, Madison, Wisconsin 53706 (United States)
  2. Consorzio RFX, Associazione Euratom-ENEA per la Fusione, Padova (Italy)
Publication Date:
OSTI Identifier:
22314465
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 85; Journal Issue: 9; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; ALUMINIUM; BREMSSTRAHLUNG; CATHODES; ELECTRON TEMPERATURE; HOT PLASMA; KEV RANGE; MST DEVICE; PHOTODIODES; RADIATION DETECTORS; SENSITIVITY; SIGNALS; SILICON; SOFT X RADIATION; X-RAY DETECTION

Citation Formats

McGarry, M. B., E-mail: mbmcgarry@wisc.edu, Den Hartog, D. J., Goetz, J. A., Johnson, J., and Franz, P. Note: Effect of photodiode aluminum cathode frame on spectral sensitivity in the soft x-ray energy band. United States: N. p., 2014. Web. doi:10.1063/1.4894656.
McGarry, M. B., E-mail: mbmcgarry@wisc.edu, Den Hartog, D. J., Goetz, J. A., Johnson, J., & Franz, P. Note: Effect of photodiode aluminum cathode frame on spectral sensitivity in the soft x-ray energy band. United States. doi:10.1063/1.4894656.
McGarry, M. B., E-mail: mbmcgarry@wisc.edu, Den Hartog, D. J., Goetz, J. A., Johnson, J., and Franz, P. Mon . "Note: Effect of photodiode aluminum cathode frame on spectral sensitivity in the soft x-ray energy band". United States. doi:10.1063/1.4894656.
@article{osti_22314465,
title = {Note: Effect of photodiode aluminum cathode frame on spectral sensitivity in the soft x-ray energy band},
author = {McGarry, M. B., E-mail: mbmcgarry@wisc.edu and Den Hartog, D. J. and Goetz, J. A. and Johnson, J. and Franz, P.},
abstractNote = {Silicon photodiodes used for soft x-ray detection typically have a thin metal electrode partially covering the active area of the photodiode, which subtly alters the spectral sensitivity of the photodiode. As a specific example, AXUV4BST photodiodes from International Radiation Detectors have a 1.0 μm thick aluminum frame covering 19% of the active area of the photodiode, which attenuates the measured x-ray signal below ∼6 keV. This effect has a small systematic impact on the electron temperature calculated from measurements of soft x-ray bremsstrahlung emission from a high-temperature plasma. Although the systematic error introduced by the aluminum frame is only a few percent in typical experimental conditions on the Madison Symmetric Torus, it may be more significant for other instruments that use similar detectors.},
doi = {10.1063/1.4894656},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 9,
volume = 85,
place = {United States},
year = {2014},
month = {9}
}