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Title: Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading

Abstract

We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ∼10{sup 3}–10{sup 4} s{sup −1} in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This approach employs moderate x-ray energies (10–20 keV) and is well suited to weakly absorbing materials such as magnesium alloys. The second technique is useful for more strongly absorbing materials, and uses high-energy x-rays (86 keV) and a fast shutter synchronized with the Kolsky bar to produce short (∼40 μs) pulses timed with the arrival of the strain pulse at the specimen, recording the diffraction pattern on a large-format amorphous silicon detector. For both techniques we present sample data demonstrating the ability of these techniques to characterize elastic strains and polycrystalline texture as a function of time during high-rate deformation.

Authors:
; ; ; ;  [1];  [2];  [3];  [4];  [5];  [6];  [7];  [4]; ; ; ;  [6];  [8]; ;  [9]; more »; ;  [10] « less
  1. Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States)
  2. Department of NanoEngineering, University of California San Diego, La Jolla, California 92093 (United States)
  3. Oak Ridge Institute for Science and Education, Oak Ridge, Tennessee 37830 (United States)
  4. (United States)
  5. US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005 (United States)
  6. Department of Physics, Cornell University, Ithaca, New York 14853 (United States)
  7. (CHESS), Cornell University, Ithaca, New York 14853 (United States)
  8. Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853 (United States)
  9. Department of Mechanical Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States)
  10. X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Publication Date:
OSTI Identifier:
22314454
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 85; Journal Issue: 9; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; DEFORMATION; DYNAMIC LOADS; KEV RANGE 10-100; MAGNESIUM ALLOYS; POLYCRYSTALS; PULSES; SI SEMICONDUCTOR DETECTORS; STRAIN RATE; TIME DEPENDENCE; TIME RESOLUTION; X-RAY DIFFRACTION

Citation Formats

Lambert, P. K., Hustedt, C. J., Zhao, M., Ananiadis, A. G., Hufnagel, T. C., Vecchio, K. S., Huskins, E. L., US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005, Casem, D. T., Gruner, S. M., Cornell High Energy Synchrotron Source, Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York 14853, Tate, M. W., Philipp, H. T., Purohit, P., Weiss, J. T., Woll, A. R., Kannan, V., Ramesh, K. T., Kenesei, P., Okasinski, J. S., and Almer, J. Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading. United States: N. p., 2014. Web. doi:10.1063/1.4893881.
Lambert, P. K., Hustedt, C. J., Zhao, M., Ananiadis, A. G., Hufnagel, T. C., Vecchio, K. S., Huskins, E. L., US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005, Casem, D. T., Gruner, S. M., Cornell High Energy Synchrotron Source, Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York 14853, Tate, M. W., Philipp, H. T., Purohit, P., Weiss, J. T., Woll, A. R., Kannan, V., Ramesh, K. T., Kenesei, P., Okasinski, J. S., & Almer, J. Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading. United States. doi:10.1063/1.4893881.
Lambert, P. K., Hustedt, C. J., Zhao, M., Ananiadis, A. G., Hufnagel, T. C., Vecchio, K. S., Huskins, E. L., US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005, Casem, D. T., Gruner, S. M., Cornell High Energy Synchrotron Source, Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York 14853, Tate, M. W., Philipp, H. T., Purohit, P., Weiss, J. T., Woll, A. R., Kannan, V., Ramesh, K. T., Kenesei, P., Okasinski, J. S., and Almer, J. Mon . "Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading". United States. doi:10.1063/1.4893881.
@article{osti_22314454,
title = {Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading},
author = {Lambert, P. K. and Hustedt, C. J. and Zhao, M. and Ananiadis, A. G. and Hufnagel, T. C. and Vecchio, K. S. and Huskins, E. L. and US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005 and Casem, D. T. and Gruner, S. M. and Cornell High Energy Synchrotron Source and Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York 14853 and Tate, M. W. and Philipp, H. T. and Purohit, P. and Weiss, J. T. and Woll, A. R. and Kannan, V. and Ramesh, K. T. and Kenesei, P. and Okasinski, J. S. and Almer, J.},
abstractNote = {We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ∼10{sup 3}–10{sup 4} s{sup −1} in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This approach employs moderate x-ray energies (10–20 keV) and is well suited to weakly absorbing materials such as magnesium alloys. The second technique is useful for more strongly absorbing materials, and uses high-energy x-rays (86 keV) and a fast shutter synchronized with the Kolsky bar to produce short (∼40 μs) pulses timed with the arrival of the strain pulse at the specimen, recording the diffraction pattern on a large-format amorphous silicon detector. For both techniques we present sample data demonstrating the ability of these techniques to characterize elastic strains and polycrystalline texture as a function of time during high-rate deformation.},
doi = {10.1063/1.4893881},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 9,
volume = 85,
place = {United States},
year = {2014},
month = {9}
}