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Title: High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

Abstract

We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5–10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100–500 Hz for scan areas of several micrometers in size.

Authors:
; ; ; ; ;  [1]
  1. Ecole Polytechnique Fédérale de Lausanne, Lausanne (Switzerland)
Publication Date:
OSTI Identifier:
22314453
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 85; Journal Issue: 9; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ATOMIC FORCE MICROSCOPY; DESIGN; IMAGES; LAYERS; LIPIDS; PHOTON BEAMS; READOUT SYSTEMS

Citation Formats

Adams, Jonathan D., Nievergelt, Adrian, Erickson, Blake W., Yang, Chen, Dukic, Maja, and Fantner, Georg E., E-mail: georg.fantner@epfl.ch. High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers. United States: N. p., 2014. Web. doi:10.1063/1.4895460.
Adams, Jonathan D., Nievergelt, Adrian, Erickson, Blake W., Yang, Chen, Dukic, Maja, & Fantner, Georg E., E-mail: georg.fantner@epfl.ch. High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers. United States. doi:10.1063/1.4895460.
Adams, Jonathan D., Nievergelt, Adrian, Erickson, Blake W., Yang, Chen, Dukic, Maja, and Fantner, Georg E., E-mail: georg.fantner@epfl.ch. Mon . "High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers". United States. doi:10.1063/1.4895460.
@article{osti_22314453,
title = {High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers},
author = {Adams, Jonathan D. and Nievergelt, Adrian and Erickson, Blake W. and Yang, Chen and Dukic, Maja and Fantner, Georg E., E-mail: georg.fantner@epfl.ch},
abstractNote = {We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5–10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100–500 Hz for scan areas of several micrometers in size.},
doi = {10.1063/1.4895460},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 9,
volume = 85,
place = {United States},
year = {2014},
month = {9}
}