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Title: Refractive index of r-cut sapphire under shock pressure range 5 to 65 GPa

Abstract

High-pressure refractive index of optical window materials not only can provide information on electronic polarizability and band-gap structure, but also is important for velocity correction in particle-velocity measurement with laser interferometers. In this work, the refractive index of r-cut sapphire window at 1550 nm wavelength was measured under shock pressures of 5–65 GPa. The refractive index (n) decreases linearly with increasing shock density (ρ) for shock stress above the Hugoniot elastic limit (HEL): n = 2.0485 (± 0.0197) − 0.0729 (± 0.0043)ρ, while n remains nearly a constant for elastic shocks. This behavior is attributed to the transition from elastic (below HEL) to heterogeneous plastic deformation (above HEL). Based on the obtained refractive index-density relationship, polarizability of the shocked sapphire was also obtained.

Authors:
; ; ; ; ; ; ;  [1];  [2]
  1. Laboratory for Shock Wave and Detonation Physics, Institute of Fluid Physics, Mianyang, Sichuan 621900 (China)
  2. The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207 (China)
Publication Date:
OSTI Identifier:
22314383
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 9; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CORRECTIONS; INTERFEROMETERS; LASERS; PLASTICITY; POLARIZABILITY; PRESSURE RANGE GIGA PA; REFRACTIVE INDEX; SAPPHIRE; STRESSES; WAVELENGTHS

Citation Formats

Cao, Xiuxia, Li, Jiabo, Li, Jun, Li, Xuhai, Xu, Liang, Wang, Yuan, Zhu, Wenjun, Meng, Chuanmin, E-mail: mcm901570@126.com, and Zhou, Xianming, E-mail: xzhou0816@163.com. Refractive index of r-cut sapphire under shock pressure range 5 to 65 GPa. United States: N. p., 2014. Web. doi:10.1063/1.4894854.
Cao, Xiuxia, Li, Jiabo, Li, Jun, Li, Xuhai, Xu, Liang, Wang, Yuan, Zhu, Wenjun, Meng, Chuanmin, E-mail: mcm901570@126.com, & Zhou, Xianming, E-mail: xzhou0816@163.com. Refractive index of r-cut sapphire under shock pressure range 5 to 65 GPa. United States. doi:10.1063/1.4894854.
Cao, Xiuxia, Li, Jiabo, Li, Jun, Li, Xuhai, Xu, Liang, Wang, Yuan, Zhu, Wenjun, Meng, Chuanmin, E-mail: mcm901570@126.com, and Zhou, Xianming, E-mail: xzhou0816@163.com. Sun . "Refractive index of r-cut sapphire under shock pressure range 5 to 65 GPa". United States. doi:10.1063/1.4894854.
@article{osti_22314383,
title = {Refractive index of r-cut sapphire under shock pressure range 5 to 65 GPa},
author = {Cao, Xiuxia and Li, Jiabo and Li, Jun and Li, Xuhai and Xu, Liang and Wang, Yuan and Zhu, Wenjun and Meng, Chuanmin, E-mail: mcm901570@126.com and Zhou, Xianming, E-mail: xzhou0816@163.com},
abstractNote = {High-pressure refractive index of optical window materials not only can provide information on electronic polarizability and band-gap structure, but also is important for velocity correction in particle-velocity measurement with laser interferometers. In this work, the refractive index of r-cut sapphire window at 1550 nm wavelength was measured under shock pressures of 5–65 GPa. The refractive index (n) decreases linearly with increasing shock density (ρ) for shock stress above the Hugoniot elastic limit (HEL): n = 2.0485 (± 0.0197) − 0.0729 (± 0.0043)ρ, while n remains nearly a constant for elastic shocks. This behavior is attributed to the transition from elastic (below HEL) to heterogeneous plastic deformation (above HEL). Based on the obtained refractive index-density relationship, polarizability of the shocked sapphire was also obtained.},
doi = {10.1063/1.4894854},
journal = {Journal of Applied Physics},
number = 9,
volume = 116,
place = {United States},
year = {Sun Sep 07 00:00:00 EDT 2014},
month = {Sun Sep 07 00:00:00 EDT 2014}
}