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Title: Spin and orbital magnetic moments of Fe in the n-type ferromagnetic semiconductor (In,Fe)As

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4890733· OSTI ID:22311147
 [1]; ; ;  [2]; ; ; ;  [3]; ; ;  [4];  [5]
  1. Department of Applied Chemistry, School of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan)
  2. Department of Electrical Engineering and Information Systems, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan)
  3. Synchrotron Radiation Research Unit, Japan Atomic Energy Agency, Sayo-gun, Hyogo 679-5148 (Japan)
  4. Department of Physics, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)
  5. Synchrotron Radiation Research Organization, University of Tokyo, 1-490-2 Kouto, Sayo-cho, Tatsuno, Hyogo 679-5165 (Japan)

The electronic and magnetic properties of Fe atoms in the ferromagnetic semiconductor (In,Fe)As codoped with Be have been studied by x-ray absorption spectroscopy (XAS) and x-ray magnetic circular dichroism (XMCD) at the Fe L{sub 2,3} edge. The XAS and XMCD spectra showed simple spectral line shapes similar to Fe metal, but the ratio of the orbital and spin magnetic moments (M{sub orb}/M{sub spin}) estimated using the XMCD sum rules was significantly larger than that of Fe metal, indicating a significant orbital moment of Fe 3d electrons in (In,Fe)As:Be. The positive value of M{sub orb}/M{sub spin} implies that the Fe 3d shell is more than half-filled, which arises from the hybridization of the Fe{sup 3+} (d{sup 5}) state with the charge-transfer d{sup 6}L{sub ¯} states, where L{sub ¯} is a ligand hole in the host valence band. The XMCD intensity as a function of magnetic field indicated hysteretic behavior of the superparamagnetic-like component due to discrete ferromagnetic domains.

OSTI ID:
22311147
Journal Information:
Applied Physics Letters, Vol. 105, Issue 3; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English