Characterization of spatially resolved high resolution x-ray spectrometers for high energy density physics and light source experiments

Journal Article · Sat Nov 15 00:00:00 EST 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4890260· OSTI ID:22308595

Bitter, M.; Delgado-Aparacio, L.; Efthimion, P.; Pablant, N. A. ^[1]; Lu, J. ^[2]; Beiersdorfer, P.; Chen, H.; Magee, E. ^[3]

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1. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States)
2. Key Laboratory of Optoelectronic Technology and System of Ministry of Education, Chongqing University, Chongqing 400030 (China)
3. Physics Division, Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)

A high resolution 1D imaging x-ray spectrometer concept comprising a spherically bent crystal and a 2D pixelated detector is being optimized for diagnostics of small sources such as high energy density physics (HEDP) and synchrotron radiation or x-ray free electron laser experiments. This instrument is used on tokamak experiments for Doppler measurements of ion temperature and plasma flow velocity profiles. Laboratory measurements demonstrate a resolving power, E/ΔE of order 10 000 and spatial resolution better than 10 μm. Initial tests of the high resolution instrument on HEDP plasmas are being performed.

• OSTI ID: 22308595
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
43 PARTICLE ACCELERATORS
CRYSTALS
ENERGY DENSITY
FREE ELECTRON LASERS
LIGHT SOURCES
PLASMA
SPATIAL RESOLUTION
SYNCHROTRON RADIATION
TOKAMAK DEVICES
X-RAY SPECTROMETERS