Lattice distortions and octahedral rotations in epitaxially strained LaNiO{sub 3}/LaAlO{sub 3} superlattices
- University of Ulm, Central Facility of Electron Microscopy, Albert-Einstein Allee 11, D-89081, Ulm (Germany)
- Canadian Centre for Electron Microscopy, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4M1 (Canada)
- Max Planck Institute for Solid State Research, Heisenbergstr. 1, D-70569 Stuttgart (Germany)
- Helmholtz-Zentrum Berlin für Materialien und Energie, Lise-Meitner Campus, Hahn-Meitner-Platz 1, D-14109 Berlin (Germany)
Using a complementary combination of x-ray diffraction and atomically resolved imaging we investigated the lattice structure of epitaxial LaNiO{sub 3}/LaAlO{sub 3} superlattices grown on a compressive-strain inducing LaSrAlO{sub 4} (001) substrate. A refinement of the structure obtained from the x-ray data revealed the monoclinic I 2/c 1 1 space group. The (Ni/Al)O{sub 6} octahedral rotation angle perpendicular to the superlattice plane is enhanced, and the one parallel to the plane is reduced with respect to the corresponding bulk values. High-angle annular dark field imaging was used to determine the lattice parameters within the superlattice unit cell. High-resolution electron microscopy images of the oxygen atoms are consistent with the x-ray results.
- OSTI ID:
- 22300064
- Journal Information:
- Applied Physics Letters, Vol. 104, Issue 22; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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