Microstructure of highly strained BiFeO{sub 3} thin films: Transmission electron microscopy and electron-energy loss spectroscopy studies
- Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Germany)
Microstructure and electronic structure of highly strained bismuth ferrite (BiFeO{sub 3}) thin films grown on lanthanum aluminate substrates are studied using high-resolution transmission and scanning transmission electron microscopies and electron energy loss spectroscopy (EELS). Monoclinic and tetragonal phases were observed in films grown at different temperatures, and a mix of both phases was detected in a film grown at intermediate temperature. In this film, a smooth transition of the microstructure was found between the monoclinic and the tetragonal phases. A considerable increase in the c-axis parameters was observed in both phases compared with the rhombohedral bulk phase. The off-center displacement of iron (Fe) ions was increased in the monoclinic phase as compared with the tetragonal phase. EEL spectra show different electronic structures in the monoclinic and the tetragonal phases. These experimental observations are well consistent with the results of theoretical first-principle calculations performed.
- OSTI ID:
- 22275597
- Journal Information:
- Journal of Applied Physics, Vol. 115, Issue 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINATES
BISMUTH COMPOUNDS
COMPARATIVE EVALUATIONS
ELECTRON SPECTRA
ELECTRONIC STRUCTURE
ENERGY-LOSS SPECTROSCOPY
FERRITES
IRON IONS
LANTHANUM COMPOUNDS
MICROSTRUCTURE
MONOCLINIC LATTICES
STRAINS
SUBSTRATES
TEMPERATURE DEPENDENCE
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
TRIGONAL LATTICES