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Title: Prediction of Debye-Scherrer diffraction patterns in arbitrarily strained samples

Abstract

The prediction of Debye-Scherrer diffraction patterns from strained samples is typically conducted in the small strain limit. Although valid for small deviations from the hydrostat (such as the conditions of finite strength typically observed in diamond anvil cells) this assertion is likely to fail for the large strain anisotropies (often of order 10% in normal strain) found in uniaxially loaded dynamic compression experiments. In this paper, we derive a general form for the (θ{sub B},ϕ) dependence of the diffraction for an arbitrarily deformed polycrystalline sample in any geometry, and of any crystal symmetry. We show that this formula is consistent with ray traced diffraction for highly strained computationally generated polycrystals, and that the formula shows deviations from the widely used small strain solutions previously reported.

Authors:
;  [1]
  1. Department of Physics, Clarendon Laboratory, University of Oxford, Parks Road, Oxford OX1 3PU (United Kingdom)
Publication Date:
OSTI Identifier:
22273452
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 115; Journal Issue: 17; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANISOTROPY; COMPRESSION; DIFFRACTION; DYNAMIC LOADS; POLYCRYSTALS; STRAINS

Citation Formats

Higginbotham, Andrew, and McGonegle, David. Prediction of Debye-Scherrer diffraction patterns in arbitrarily strained samples. United States: N. p., 2014. Web. doi:10.1063/1.4874656.
Higginbotham, Andrew, & McGonegle, David. Prediction of Debye-Scherrer diffraction patterns in arbitrarily strained samples. United States. doi:10.1063/1.4874656.
Higginbotham, Andrew, and McGonegle, David. Wed . "Prediction of Debye-Scherrer diffraction patterns in arbitrarily strained samples". United States. doi:10.1063/1.4874656.
@article{osti_22273452,
title = {Prediction of Debye-Scherrer diffraction patterns in arbitrarily strained samples},
author = {Higginbotham, Andrew and McGonegle, David},
abstractNote = {The prediction of Debye-Scherrer diffraction patterns from strained samples is typically conducted in the small strain limit. Although valid for small deviations from the hydrostat (such as the conditions of finite strength typically observed in diamond anvil cells) this assertion is likely to fail for the large strain anisotropies (often of order 10% in normal strain) found in uniaxially loaded dynamic compression experiments. In this paper, we derive a general form for the (θ{sub B},ϕ) dependence of the diffraction for an arbitrarily deformed polycrystalline sample in any geometry, and of any crystal symmetry. We show that this formula is consistent with ray traced diffraction for highly strained computationally generated polycrystals, and that the formula shows deviations from the widely used small strain solutions previously reported.},
doi = {10.1063/1.4874656},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 17,
volume = 115,
place = {United States},
year = {2014},
month = {5}
}