Contrasting the experimental properties of hydrogen in SnO{sub 2}, In{sub 2}O{sub 3}, and TiO{sub 2}
- Department of Physics and the Sherman Fairchild Laboratory, Lehigh University, Bethlehem, Pennsylvania 18015 (United States)
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
IR spectroscopy has been used to investigate the properties of H and D in single crystals of the transparent conducting oxides, SnO{sub 2}, and In{sub 2}O{sub 3}. H introduces several O-H stretching lines and also the broad absorption arising from free carriers. IR spectroscopy has been used to identify the sources of n-type conductivity, its thermal stability, and the reactions of H-containing defects. The properties of OH and OD centers in TiO{sub 2}, while studied for decades, reveal new surprises and properties that are in sharp contrast to the shallow, H-related donors seen in SnO{sub 2} and In{sub 2}O{sub 3}. Recent theory and EPR experiments find that electrons in TiO{sub 2} become self-trapped at Ti sites to form small polarons. The OD center in TiO{sub 2} shows a multiline vibrational spectrum with an unusual temperature dependence that can be explained by a small polaron model with the donor electron self-trapped at different Ti sites near the OD oscillator.
- OSTI ID:
- 22271086
- Journal Information:
- Journal of Applied Physics, Vol. 115, Issue 1; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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