Modeling ellipsometry and electron energy loss spectroscopy of graphene
- Department of Applied Mathematics, University of Waterloo, 200 University Ave W, N2L 3G1, Waterloo, Ontario (Canada)
- College of Nanoscale Science and Engineering, State University of New York at Albany, 255 Fuller Rd., Albany, New York 12203 (United States)
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)
Recent studies of electronic excitations in graphene by Electron Energy Loss Spectroscopy (EELS) have revealed massive high-frequency peaks assigned to the π and σ+π plasmons [1], which were semi-quantitatively modeled with a two-dimensional, two-fluid hydrodynamic (HD) model [2]. On the other hand, Spectroscopic Ellipsometry (SE) of graphene covers the region of nearly constant absorbance due to graphene’s universal optical conductivity at infrared frequencies, which is not clearly resolved by EELS, and goes up to cover the π-plasmon peak at ultraviolet frequencies [3]. To attempt to model both the SE and EELS, we amend the HD model by including a low-frequency contribution of graphene’s inter-band transitions, while monitoring the fulfillment of the f-sum rule [4] up to frequencies that cover excitations of all valence electrons.
- OSTI ID:
- 22265926
- Journal Information:
- AIP Conference Proceedings, Vol. 1590, Issue 1; Conference: International conference on electronic, photonic, plasmonic and magnetic properties of nanomaterials, London (Canada), 12-16 Aug 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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