Note: Spring constant calibration of nanosurface-engineered atomic force microscopy cantilevers

Journal Article · Sat Feb 15 00:00:00 EST 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4864195· OSTI ID:22253504

Palasantzas, G.; Kooi, B. J. ^[1]

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1. Nanostructured Materials and Interfaces Group, Zernike Institute for Advanced Materials, Nijenborgh 4, 9747 AG Groningen (Netherlands)

The determination of the dynamic spring constant (k{sub d}) of atomic force microscopy cantilevers is of crucial importance for converting cantilever deflection to accurate force data. Indeed, the non-destructive, fast, and accurate measurement method of the cantilever dynamic spring constant by Sader et al. [Rev. Sci. Instrum. 83, 103705 (2012)] is confirmed here for plane geometry but surface modified cantilevers. It is found that the measured spring constants (k{sub eff}, the dynamic one k{sub d}), and the calculated (k{sub d,1}) are in good agreement within less than 10% error.

• OSTI ID: 22253504
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 2; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ATOMIC FORCE MICROSCOPY
CALIBRATION
ENGINEERS
ERRORS
GEOMETRY
SPRINGS