Resolving microstructures in Z pinches with intensity interferometry
- Consultant to NRL through Engility Corp., Chantilly, Virginia 20151 (United States)
- Weizmann Institute of Science, Rehovot 76100 (Israel)
- Plasma Physics Division, Naval Research Laboratory, Washington, DC 20375 (United States)
Nearly 60 years ago, Hanbury Brown and Twiss [R. Hanbury Brown and R. Q. Twiss, Nature 178, 1046 (1956)] succeeded in measuring the 30 nrad angular diameter of Sirius using a new type of interferometry that exploited the interference of photons independently emitted from different regions of the stellar disk. Its basis was the measurement of intensity correlations as a function of detector spacing, with no beam splitting or preservation of phase information needed. Applied to Z pinches, X pinches, or laser-produced plasmas, this method could potentially provide spatial resolution under one micron. A quantitative analysis based on the work of Purcell [E. M. Purcell, Nature 178, 1449 (1956)] reveals that obtaining adequate statistics from x-ray interferometry of a Z-pinch microstructure would require using the highest-current generators available. However, using visible light interferometry would reduce the needed photon count and could enable its use on sub-MA machines.
- OSTI ID:
- 22252014
- Journal Information:
- Physics of Plasmas, Vol. 21, Issue 3; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 1070-664X
- Country of Publication:
- United States
- Language:
- English
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