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Title: A 350 mK, 9 T scanning tunneling microscope for the study of superconducting thin films on insulating substrates and single crystals

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4849616· OSTI ID:22250747
; ; ; ;  [1];  [2]
  1. Department of Condensed Matter Physics and Materials Science, Tata Institute of Fundamental Research, Homi Bhabha Rd., Colaba, Mumbai 400 005 (India)
  2. Excel Instruments, 28, Sarvodaya Industrial Premises, Off Mahakali Caves Road, Andheri (East), Mumbai 400 093 (India)

We report the construction and performance of a low temperature, high field scanning tunneling microscope (STM) operating down to 350 mK and in magnetic fields up to 9 T, with thin film deposition and in situ single crystal cleaving capabilities. The main focus lies on the simple design of STM head and a sample holder design that allows us to get spectroscopic data on superconducting thin films grown in situ on insulating substrates. Other design details on sample transport, sample preparation chamber, and vibration isolation schemes are also described. We demonstrate the capability of our instrument through the atomic resolution imaging and spectroscopy on NbSe{sub 2} single crystal and spectroscopic maps obtained on homogeneously disordered NbN thin film.

OSTI ID:
22250747
Journal Information:
Review of Scientific Instruments, Vol. 84, Issue 12; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English