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Title: Direct measurement of band offset at the interface between CdS and Cu{sub 2}ZnSnS{sub 4} using hard X-ray photoelectron spectroscopy

Abstract

We directly and non-destructively measured the valence band offset at the interface between CdS and Cu{sub 2}ZnSnS{sub 4} (CZTS) using hard X-ray photoelectron spectroscopy (HAXPES), which can measure the electron state of the buried interface because of its large analysis depth. These measurements were made using the following real devices; CZTS(t = 700 nm), CdS(t = 100 nm)/CZTS(t = 700 nm), and CdS(t = 5 nm)/CZTS(t = 700 nm) films formed on Mo coated glass. The valence band spectra were measured by HAXPES using an X-ray photon energy of 8 keV. The value of the valence band offset at the interface between CdS and CZTS was estimated as 1.0 eV by fitting the spectra. The conduction band offset could be deduced as 0.0 eV from the obtained valence band offset and the band gap energies of CdS and CZTS.

Authors:
; ; ; ; ; ;  [1]
  1. Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi 480-1192 (Japan)
Publication Date:
OSTI Identifier:
22217758
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 103; Journal Issue: 24; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 36 MATERIALS SCIENCE; CADMIUM SULFIDES; DEPTH; EV RANGE; GLASS; HARD X RADIATION; INTERFACES; KEV RANGE 01-10; SEMICONDUCTOR MATERIALS; SOCIO-ECONOMIC FACTORS; SPECTRA; THIN FILMS; VALENCE; X-RAY PHOTOELECTRON SPECTROSCOPY

Citation Formats

Tajima, Shin, Kataoka, Keita, Takahashi, Naoko, Kimoto, Yasuji, Fukano, Tatsuo, Hasegawa, Masaki, and Hazama, Hirofumi. Direct measurement of band offset at the interface between CdS and Cu{sub 2}ZnSnS{sub 4} using hard X-ray photoelectron spectroscopy. United States: N. p., 2013. Web. doi:10.1063/1.4850235.
Tajima, Shin, Kataoka, Keita, Takahashi, Naoko, Kimoto, Yasuji, Fukano, Tatsuo, Hasegawa, Masaki, & Hazama, Hirofumi. Direct measurement of band offset at the interface between CdS and Cu{sub 2}ZnSnS{sub 4} using hard X-ray photoelectron spectroscopy. United States. https://doi.org/10.1063/1.4850235
Tajima, Shin, Kataoka, Keita, Takahashi, Naoko, Kimoto, Yasuji, Fukano, Tatsuo, Hasegawa, Masaki, and Hazama, Hirofumi. 2013. "Direct measurement of band offset at the interface between CdS and Cu{sub 2}ZnSnS{sub 4} using hard X-ray photoelectron spectroscopy". United States. https://doi.org/10.1063/1.4850235.
@article{osti_22217758,
title = {Direct measurement of band offset at the interface between CdS and Cu{sub 2}ZnSnS{sub 4} using hard X-ray photoelectron spectroscopy},
author = {Tajima, Shin and Kataoka, Keita and Takahashi, Naoko and Kimoto, Yasuji and Fukano, Tatsuo and Hasegawa, Masaki and Hazama, Hirofumi},
abstractNote = {We directly and non-destructively measured the valence band offset at the interface between CdS and Cu{sub 2}ZnSnS{sub 4} (CZTS) using hard X-ray photoelectron spectroscopy (HAXPES), which can measure the electron state of the buried interface because of its large analysis depth. These measurements were made using the following real devices; CZTS(t = 700 nm), CdS(t = 100 nm)/CZTS(t = 700 nm), and CdS(t = 5 nm)/CZTS(t = 700 nm) films formed on Mo coated glass. The valence band spectra were measured by HAXPES using an X-ray photon energy of 8 keV. The value of the valence band offset at the interface between CdS and CZTS was estimated as 1.0 eV by fitting the spectra. The conduction band offset could be deduced as 0.0 eV from the obtained valence band offset and the band gap energies of CdS and CZTS.},
doi = {10.1063/1.4850235},
url = {https://www.osti.gov/biblio/22217758}, journal = {Applied Physics Letters},
issn = {0003-6951},
number = 24,
volume = 103,
place = {United States},
year = {Mon Dec 09 00:00:00 EST 2013},
month = {Mon Dec 09 00:00:00 EST 2013}
}