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Title: Sol–gel synthesis and electrical characterization of Bi{sub 3.25}La{sub 0.75}Ti{sub 3}O{sub 12} thin films

Journal Article · · Materials Research Bulletin
; ;  [1]
  1. Department of Ceramics and Glass Engineering, Centre for Research in Ceramics and Composite Materials, CICECO, University of Aveiro, 3810-193 Aveiro (Portugal)

Graphical abstract: Display Omitted Highlights: ► Bi{sub 3.25}La{sub 0.75}Ti{sub 3}O{sub 12} (BLT) thin films on Pt/TiO{sub 2}/SiO{sub 2}/Si substrates prepared by sol–gel. ► Ethylacetoacetate (EAA) used as a replacement for highly toxic 2-methoxyethanol. ► 0.4 μm thick BLT film has 2P{sub r} ∼ 21 μC/cm{sup 2} and 2E{sub c} of ∼195 kV/cm at 300 kV/cm, εr = 140 and tan δ = 0.025, 1 kHz. ► BLT films with improved dielectric response when prepared form ethylacetoacetate (EAA). -- Abstract: Lanthanum bismuth titanate (Bi{sub 3.25}La{sub 0.75}Ti{sub 3}O{sub 12}) (BLT) thin films on Pt/TiO{sub 2}/SiO{sub 2}/Si substrates were prepared by sol–gel using ethylacetoacetate (EAA) as a replacement for the highly toxic 2-methoxyethanol. EAA is used as a modifier to stabilize the metal alkoxide. At 450 °C films are amorphous. After annealing at 650 °C films are crystalline and present good dielectric and ferroelectric properties. A 0.4 μm thick BLT film exhibits 2P{sub r} of ∼21 μC/cm{sup 2} and 2E{sub c} of ∼195 kV/cm at 300 kV/cm. The dielectric constant and dielectric losses of these BLT films at 1 kHz are 140 and 0.025, respectively.

OSTI ID:
22215626
Journal Information:
Materials Research Bulletin, Vol. 47, Issue 11; Other Information: Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
Country of Publication:
United States
Language:
English