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Title: In situ growth of ZrO{sub 2}–Al{sub 2}O{sub 3} nano-crystalline ceramic coatings via micro arc oxidation of aluminum substrates

Journal Article · · Materials Research Bulletin
 [1];  [2];  [1];  [1]
  1. School of Metallurgy and Materials Engineering, Iran University of Science and Technology, P.O. Box 16845-161, Tehran (Iran, Islamic Republic of)
  2. Department of Metals and Materials Engineering, University of British Columbia, Vancouver, BC V6T 1Z4 (Canada)

Highlights: ► ZrO{sub 2}–Al{sub 2}O{sub 3} layers were fabricated by MAO process. ► A formation mechanism was also proposed. ► Effect of voltage and electrolyte composition on layers properties was studied. -- Abstract: Micro arc oxidation technique was employed to grow zirconia–alumina porous layers. Considering XPS, XRD, and EDX results, the layers mainly consisted of α-Al{sub 2}O{sub 3}, γ-Al{sub 2}O{sub 3}, monoclinic ZrO{sub 2}, tetragonal ZrO{sub 2}. Fractions of these phases were observed to change based on the fabrication conditions. Zirconia phases formed not only on the surface, but also in the layers depth. Increasing the voltage as well as utilizing thicker electrolytes resulted in higher zirconium concentration. The average crystalline size of the ZrO{sub 2} and the Al{sub 2}O{sub 3} phases was determined as about 57 and 75 nm. AFM studies revealed that the surface roughness increased with voltage and electrolyte concentration. Morphological evaluations, performed by SEM, showed that the microstructure of the layers strongly depended on the synthesis conditions. The layers revealed a porous structure with a pores size of 40–300 nm. Microcracks were observed to appear when the electrolyte concentration and the applied voltage increased. Finally, a formation mechanism was put forward with emphasis on the chemical and the electrochemical foundations.

OSTI ID:
22215116
Journal Information:
Materials Research Bulletin, Vol. 47, Issue 6; Other Information: Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
Country of Publication:
United States
Language:
English