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Title: Dielectric relaxation related to single-ionized oxygen vacancies in (Pb{sub 1-x}La{sub x})(Zr{sub 0.90}Ti{sub 0.10}){sub 1-x/4}O{sub 3} ceramics

Abstract

The dielectric relaxation phenomenon has been studied in lanthanum modified lead zirconate titanate ceramics in the high temperature paraelectric phase. The high temperature dielectric response revealed an anomalous behavior, which is characterized by an increase of the real component of the dielectric permittivity with the increase of the temperature. At the same time, a similar behavior, with very high values, has been observed in the imaginary component of the dielectric permittivity, which can be associated with conduction effects related to the conductivity losses. The frequency and temperature behavior of the complex dielectric permittivity has been analyzed considering the semi-empirical complex Cole-Cole equation. The activation energy value, obtained from the Arrhenius' dependence for the relaxation time, was found to decreases with the increase of the lanthanum concentration and has been associated with single-ionized oxygen vacancies. The short-range hopping of oxygen vacancies is discussed as the main cause of the dielectric relaxation.

Authors:
 [1];  [2]
  1. Facultad de Fisica-Instituto de Ciencia y Tecnologia de Materiales, Universidad de La Habana. San Lazaro y L, Vedado, La Habana 10400 (Cuba)
  2. Grupo de Ferroeletricos e Materiais Multifuncionais, Instituto de fisica, Universidade Federal de Uberlandia, 38400-902 Uberlandia, MG (Brazil)
Publication Date:
OSTI Identifier:
22207392
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 45; Journal Issue: 9; Other Information: Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ACTIVATION ENERGY; CERAMICS; DIELECTRIC MATERIALS; IONIC CONDUCTIVITY; LANTHANUM; OXYGEN; PERMITTIVITY; RELAXATION TIME

Citation Formats

Pelaiz-Barranco, A., E-mail: pelaiz@fisica.uh.cu, and Guerra, J.D.S.. Dielectric relaxation related to single-ionized oxygen vacancies in (Pb{sub 1-x}La{sub x})(Zr{sub 0.90}Ti{sub 0.10}){sub 1-x/4}O{sub 3} ceramics. United States: N. p., 2010. Web. doi:10.1016/J.MATERRESBULL.2010.04.026.
Pelaiz-Barranco, A., E-mail: pelaiz@fisica.uh.cu, & Guerra, J.D.S.. Dielectric relaxation related to single-ionized oxygen vacancies in (Pb{sub 1-x}La{sub x})(Zr{sub 0.90}Ti{sub 0.10}){sub 1-x/4}O{sub 3} ceramics. United States. doi:10.1016/J.MATERRESBULL.2010.04.026.
Pelaiz-Barranco, A., E-mail: pelaiz@fisica.uh.cu, and Guerra, J.D.S.. Wed . "Dielectric relaxation related to single-ionized oxygen vacancies in (Pb{sub 1-x}La{sub x})(Zr{sub 0.90}Ti{sub 0.10}){sub 1-x/4}O{sub 3} ceramics". United States. doi:10.1016/J.MATERRESBULL.2010.04.026.
@article{osti_22207392,
title = {Dielectric relaxation related to single-ionized oxygen vacancies in (Pb{sub 1-x}La{sub x})(Zr{sub 0.90}Ti{sub 0.10}){sub 1-x/4}O{sub 3} ceramics},
author = {Pelaiz-Barranco, A., E-mail: pelaiz@fisica.uh.cu and Guerra, J.D.S.},
abstractNote = {The dielectric relaxation phenomenon has been studied in lanthanum modified lead zirconate titanate ceramics in the high temperature paraelectric phase. The high temperature dielectric response revealed an anomalous behavior, which is characterized by an increase of the real component of the dielectric permittivity with the increase of the temperature. At the same time, a similar behavior, with very high values, has been observed in the imaginary component of the dielectric permittivity, which can be associated with conduction effects related to the conductivity losses. The frequency and temperature behavior of the complex dielectric permittivity has been analyzed considering the semi-empirical complex Cole-Cole equation. The activation energy value, obtained from the Arrhenius' dependence for the relaxation time, was found to decreases with the increase of the lanthanum concentration and has been associated with single-ionized oxygen vacancies. The short-range hopping of oxygen vacancies is discussed as the main cause of the dielectric relaxation.},
doi = {10.1016/J.MATERRESBULL.2010.04.026},
journal = {Materials Research Bulletin},
number = 9,
volume = 45,
place = {United States},
year = {Wed Sep 15 00:00:00 EDT 2010},
month = {Wed Sep 15 00:00:00 EDT 2010}
}