Application of EELS in Materials Science

Journal Article · Thu Nov 15 00:00:00 EST 2012 · Materials Characterization

DOI:https://doi.org/10.1016/J.MATCHAR.2012.07.013· OSTI ID:22163139

Keast, V.J., E-mail: [e-mail]

Electron energy-loss spectroscopy (EELS) in the transmission electron microscope (TEM) has become widely used for the analysis of the composition and electronic structure of materials at the nanoscale. This tutorial review provides an overview of the theory and applications of the technique and a few examples are provided to illustrate the type of information available. Some of the recent developments and future prospects of EELS are discussed.

• OSTI ID: 22163139
• Journal Information: Materials Characterization, Vol. 73, Issue Complete; Other Information: Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALLOYS
DIELECTRIC MATERIALS
ELECTRONIC STRUCTURE
ELECTRONS
ENERGY-LOSS SPECTROSCOPY
METALS
NANOSTRUCTURES
TRANSMISSION ELECTRON MICROSCOPY