System of laser pump and synchrotron radiation probe microdiffraction to investigate optical recording process

Journal Article · Sat Jun 15 00:00:00 EDT 2013 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4807858· OSTI ID:22118654

Yasuda, Nobuhiro; Fukuyama, Yoshimitsu; Osawa, Hitoshi ^[1]; Kimura, Shigeru ^[1]; Ito, Kiminori; Tanaka, Yoshihito ^[2]; Matsunaga, Toshiyuki; Kojima, Rie; Hisada, Kazuya; Tsuchino, Akio; Birukawa, Masahiro ^[3]; Yamada, Noboru ^[4]; Sekiguchi, Koji; Fujiie, Kazuhiko; Kawakubo, Osamu ^[5]; Takata, Masaki ^[1]

---

1. Research and Utilization Division, Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan)
2. RIKEN SPring-8 Center, RIKEN, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan)
3. R and D Division, Panasonic Corporation, 3-4 Hikaridai, Seika-cho, Soraku-gun, Kyoto 619-0237 (Japan)
4. Department of Materials Science and Engineering, Kyoto University, Yoshida-honmachi, Sakyo-ku, Kyoto, Kyoto 606-8501 (Japan)
5. Advanced Optical Storage Development Department, Advanced Device Technology Platform, Sony Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa 243-0014 (Japan)

We have developed a system of laser-pump and synchrotron radiation probe microdiffraction to investigate the phase-change process on a nanosecond time scale of Ge{sub 2}Sb{sub 2}Te{sub 5} film embedded in multi-layer structures, which corresponds to real optical recording media. The measurements were achieved by combining (i) the pump-laser system with a pulse width of 300 ps, (ii) a highly brilliant focused microbeam with wide peak-energy width ({Delta}E/E {approx} 2%) made by focusing helical undulator radiation without monochromatization, and (iii) a precise sample rotation stage to make repetitive measurements. We successfully detected a very weak time-resolved diffraction signal by using this system from 100-nm-thick Ge{sub 2}Sb{sub 2}Te{sub 5} phase-change layers. This enabled us to find the dependence of the crystal-amorphous phase change process of the Ge{sub 2}Sb{sub 2}Te{sub 5} layers on laser power.

• OSTI ID: 22118654
• Journal Information: Review of Scientific Instruments, Vol. 84, Issue 6; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
36 MATERIALS SCIENCE
AMORPHOUS STATE
CRYSTALS
DIFFRACTION
FILMS
GERMANIUM COMPOUNDS
LASERS
LAYERS
OPTICAL PUMPING
ORDER-DISORDER TRANSFORMATIONS
PEAKS
PHASE CHANGE MATERIALS
PROBES
PULSES
PUMPS
SIGNALS
STORAGE
SYNCHROTRON RADIATION
TIME RESOLUTION