Improved optical and electrical properties of 200 MeV Ag{sup 15+} irradiated 3 wt% 'Li' doped MoO{sub 3} thin film
- Department of Physics, Presidency College, Chennai - 600005 (India)
- Center for Condensed Matter Sciences, National Taiwan University, Taipei - 10617, Taiwan (China)
- Department of Nuclear Physics, University of Madras, Guindy Campus, Chennai - 600025 (India)
- Department of Physics, Pukyong National University, Busan 608-737 (Korea, Republic of)
- Interuniversity Accelerator Centre, Aruna Asaf Ali Marg, New Delhi, 110 067 (India)
The lithium (3 wt%) doped MoO{sub 3} thin film was prepared by spray deposition onto ITO substrate at 325 Degree-Sign C. The film of thickness 577 nm was irradiated with 200 MeV Ag{sup 15+} ion beams at a fluence of 5 Multiplication-Sign 10{sup 12} ions/cm{sup 2}. The XRD pattern confirmed that the pristine film is polycrystalline with orthorhombic symmetry. Upon irradiation, the film turned amorphous. The sharp Raman peak in pristine film at 993 cm{sup -1} is due to the terminal oxygen of {alpha}-MoO{sub 3} phase. Optical transparency of the film increased upon irradiation. Large red shift was observed in both direct and indirect band gaps. Electrical transport property study shows that the carrier concentration increased by one order for the irradiated film.
- OSTI ID:
- 22116013
- Journal Information:
- AIP Conference Proceedings, Vol. 1512, Issue 1; Conference: 57. DAE solid state physics symposium 2012, Mumbai (India), 3-7 Dec 2012; Other Information: (c) 2013 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
AMORPHOUS STATE
CARRIER DENSITY
DOPED MATERIALS
ELECTRIC CONDUCTIVITY
ELECTRONIC STRUCTURE
ION BEAMS
IRRADIATION
LITHIUM COMPOUNDS
MEV RANGE
MOLYBDENUM OXIDES
MULTICHARGED IONS
OPACITY
ORTHORHOMBIC LATTICES
POLYCRYSTALS
RADIATION EFFECTS
RAMAN SPECTRA
SILVER IONS
SPRAYED COATINGS
THIN FILMS
X-RAY DIFFRACTION