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Title: Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines

Abstract

Quantitative analysis of X-ray absorption and dichroism data requires knowledge of the beamline photon flux during the measurements. We show that thin conductive (B-doped) diamond thin films can be an alternative to the widely used gold meshes for monitoring the beam intensity of soft X-ray beamlines in situ. Limited by the carbon extended x-ray absorption fine structure oscillations, the diamond films become applicable beginning from about 600 eV photon energy, where the important transition metal edges and the rare-earth edges are found. The 100 nm and 250 nm thick free-standing diamond films were grown and tested against standard gold meshes in real-life dichroism experiments performed at beamline ID08 of the European Synchrotron Radiation Facility, Grenoble, France. Quantitative agreement was found between the two experimental data sets. The films feature an extremely high transmission of about 90% and, at the same time, yield a sufficiently strong and clean reference signal. Furthermore, the thin films do not affect the shape of the transmitted beam. X-rays passing mesh-type monitors are subject to diffraction effects, which widen the beam and become particularly disturbing for small beamsizes in the micrometer range.

Authors:
; ; ; ;  [1]; ; ;  [2];  [3];  [3]
  1. European Synchrotron Radiation Facility, 6 Rue Jules Horowitz, B.P. 220, F-38043 Grenoble Cedex (France)
  2. Hasselt University, Institute for Materials Research (IMO), Wetenschapspark 1, B-3590 Diepenbeek (Belgium)
  3. Fraunhofer Institut Angewandte Festkoerperphysik, Tullastrasse 72, 79108 Freiburg (Germany)
Publication Date:
OSTI Identifier:
22105463
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 84; Journal Issue: 3; Other Information: (c) 2013 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 36 MATERIALS SCIENCE; ABSORPTION SPECTROSCOPY; BEAMS; BORON; DIAMONDS; DICHROISM; DIFFRACTION; DOPED MATERIALS; EUROPEAN SYNCHROTRON RADIATION FACILITY; EXPERIMENTAL DATA; GOLD; MONITORING; MONITORS; PHOTONS; RARE EARTHS; SOFT X RADIATION; THIN FILMS; X-RAY SPECTROSCOPY

Citation Formats

Kummer, K., Fondacaro, A., Yakhou-Harris, F., Sessi, V., Brookes, N. B., Pobedinskas, P., Janssens, S. D., Haenen, K., IMEC vzw, IMOMEC, Wetenschapspark 1, B-3590 Diepenbeek, Williams, O. A., School of Physics and Astronomy, Cardiff University, Queens Buildings, The Parade, Cardiff CF24 3AA, and Hees, J. Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines. United States: N. p., 2013. Web. doi:10.1063/1.4794439.
Kummer, K., Fondacaro, A., Yakhou-Harris, F., Sessi, V., Brookes, N. B., Pobedinskas, P., Janssens, S. D., Haenen, K., IMEC vzw, IMOMEC, Wetenschapspark 1, B-3590 Diepenbeek, Williams, O. A., School of Physics and Astronomy, Cardiff University, Queens Buildings, The Parade, Cardiff CF24 3AA, & Hees, J. Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines. United States. https://doi.org/10.1063/1.4794439
Kummer, K., Fondacaro, A., Yakhou-Harris, F., Sessi, V., Brookes, N. B., Pobedinskas, P., Janssens, S. D., Haenen, K., IMEC vzw, IMOMEC, Wetenschapspark 1, B-3590 Diepenbeek, Williams, O. A., School of Physics and Astronomy, Cardiff University, Queens Buildings, The Parade, Cardiff CF24 3AA, and Hees, J. 2013. "Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines". United States. https://doi.org/10.1063/1.4794439.
@article{osti_22105463,
title = {Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines},
author = {Kummer, K. and Fondacaro, A. and Yakhou-Harris, F. and Sessi, V. and Brookes, N. B. and Pobedinskas, P. and Janssens, S. D. and Haenen, K. and IMEC vzw, IMOMEC, Wetenschapspark 1, B-3590 Diepenbeek and Williams, O. A. and School of Physics and Astronomy, Cardiff University, Queens Buildings, The Parade, Cardiff CF24 3AA and Hees, J.},
abstractNote = {Quantitative analysis of X-ray absorption and dichroism data requires knowledge of the beamline photon flux during the measurements. We show that thin conductive (B-doped) diamond thin films can be an alternative to the widely used gold meshes for monitoring the beam intensity of soft X-ray beamlines in situ. Limited by the carbon extended x-ray absorption fine structure oscillations, the diamond films become applicable beginning from about 600 eV photon energy, where the important transition metal edges and the rare-earth edges are found. The 100 nm and 250 nm thick free-standing diamond films were grown and tested against standard gold meshes in real-life dichroism experiments performed at beamline ID08 of the European Synchrotron Radiation Facility, Grenoble, France. Quantitative agreement was found between the two experimental data sets. The films feature an extremely high transmission of about 90% and, at the same time, yield a sufficiently strong and clean reference signal. Furthermore, the thin films do not affect the shape of the transmitted beam. X-rays passing mesh-type monitors are subject to diffraction effects, which widen the beam and become particularly disturbing for small beamsizes in the micrometer range.},
doi = {10.1063/1.4794439},
url = {https://www.osti.gov/biblio/22105463}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 3,
volume = 84,
place = {United States},
year = {Fri Mar 15 00:00:00 EDT 2013},
month = {Fri Mar 15 00:00:00 EDT 2013}
}