Radial profile measurement of electron temperature in edge stochastic magnetic field layer of LHD using intensity ratio of extreme ultraviolet line emissions
- Department of Fusion Science, Graduate University for Advanced Studies, Toki 509-5292, Gifu (Japan)
- National Institute for Fusion Science, Toki 509-5292, Gifu (Japan)
Vertical profile of neon line emissions in 30-650 A wavelength range has been observed in horizontally elongated plasma cross section of Large Helical Device (LHD). Intensity ratio between the neon line emissions is studied to measure the radial profile of electron temperature in the edge stochastic magnetic field layer of LHD. The edge temperature profile successfully obtained from the line ratio of NeVIII 2s-3p to 2p-3s transitions is compared with the simulation based on three-dimensional edge transport code. The result shows a reasonably good agreement with the edge temperature profile analyzed from atomic data and analysis structure code. The electron temperature at last closed flux surface measured from the intensity ratio is also in good agreement with that measured from Thomson scattering.
- OSTI ID:
- 22093952
- Journal Information:
- Review of Scientific Instruments, Vol. 83, Issue 10; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
GENERAL PHYSICS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BOUNDARY LAYERS
CROSS SECTIONS
ELECTRON TEMPERATURE
EMISSION
EXTREME ULTRAVIOLET RADIATION
ION TEMPERATURE
LHD DEVICE
MAGNETIC FIELDS
MAGNETIC SURFACES
PLASMA SIMULATION
STELLARATORS
STOCHASTIC PROCESSES
THOMSON SCATTERING