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Title: Deflection gating for time-resolved x-ray magnetic circular dichroism-photoemission electron microscopy using synchrotron radiation

Abstract

In this paper, we present a newly developed gating technique for a time-resolving photoemission microscope. The technique makes use of an electrostatic deflector within the microscope's electron optical system for fast switching between two electron-optical paths, one of which is used for imaging, while the other is blocked by an aperture stop. The system can be operated with a switching time of 20 ns and shows superior dark current rejection. We report on the application of this new gating technique to exploit the time structure in the injection bunch pattern of the synchrotron radiation source BESSY II at Helmholtz-Zentrum Berlin for time-resolved measurements in the picosecond regime.

Authors:
; ;  [1];  [1];  [2]
  1. Peter Gruenberg Institut PGI-6 'Electronic Properties', Research Centre Juelich, D-52425 Juelich (Germany)
  2. (CeNIDE), Universitaet Duisburg-Essen, D-47048 Duisburg (Germany)
Publication Date:
OSTI Identifier:
22093631
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 83; Journal Issue: 6; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BESSY STORAGE RING; ELECTRON MICROSCOPY; ELECTRO-OPTICAL EFFECTS; INJECTION; MAGNETIC CIRCULAR DICHROISM; MICROSCOPES; OPTICAL SYSTEMS; PHOTOEMISSION; SYNCHROTRON RADIATION; SYNCHROTRON RADIATION SOURCES; TIME RESOLUTION; X RADIATION

Citation Formats

Wiemann, C., Kaiser, A. M., Cramm, S., Schneider, C. M., and Fakultaet fuer Physik and Center for Nanointegration Duisburg-Essen. Deflection gating for time-resolved x-ray magnetic circular dichroism-photoemission electron microscopy using synchrotron radiation. United States: N. p., 2012. Web. doi:10.1063/1.4729603.
Wiemann, C., Kaiser, A. M., Cramm, S., Schneider, C. M., & Fakultaet fuer Physik and Center for Nanointegration Duisburg-Essen. Deflection gating for time-resolved x-ray magnetic circular dichroism-photoemission electron microscopy using synchrotron radiation. United States. doi:10.1063/1.4729603.
Wiemann, C., Kaiser, A. M., Cramm, S., Schneider, C. M., and Fakultaet fuer Physik and Center for Nanointegration Duisburg-Essen. Fri . "Deflection gating for time-resolved x-ray magnetic circular dichroism-photoemission electron microscopy using synchrotron radiation". United States. doi:10.1063/1.4729603.
@article{osti_22093631,
title = {Deflection gating for time-resolved x-ray magnetic circular dichroism-photoemission electron microscopy using synchrotron radiation},
author = {Wiemann, C. and Kaiser, A. M. and Cramm, S. and Schneider, C. M. and Fakultaet fuer Physik and Center for Nanointegration Duisburg-Essen},
abstractNote = {In this paper, we present a newly developed gating technique for a time-resolving photoemission microscope. The technique makes use of an electrostatic deflector within the microscope's electron optical system for fast switching between two electron-optical paths, one of which is used for imaging, while the other is blocked by an aperture stop. The system can be operated with a switching time of 20 ns and shows superior dark current rejection. We report on the application of this new gating technique to exploit the time structure in the injection bunch pattern of the synchrotron radiation source BESSY II at Helmholtz-Zentrum Berlin for time-resolved measurements in the picosecond regime.},
doi = {10.1063/1.4729603},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 6,
volume = 83,
place = {United States},
year = {2012},
month = {6}
}