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Title: Exchange bias properties of [Co/CoO]{sub n} multilayers

Abstract

In this study, the exchange bias properties of four polycrystalline multilayer stack samples of antiferromagnetic (AF) CoO and ferromagnetic (FM) Co in the form of [CoO/Co]{sub n} with n = 1, 2, 3, and 5 are reported. The samples were grown on top of Si (001) substrates by using magnetron sputtering method. X-ray photoelectron spectroscopy (XPS) and transmission electron microscopy (TEM) were used to determine the structural properties of the samples. XPS measurements of cobalt oxide layer revealed the coexistence of different phases in cobalt oxide as CoO and Co{sub 3}O{sub 4}, the latter of which lowers the blocking temperature. The blocking temperature is also affected by the finite size scaling effects observed in AF layers. In-plane ferromagnetic resonance (FMR) measurements revealed uniaxial in-plane magnetic anisotropy for the samples. Low temperature vibrating sample magnetometer measurements provided exchange bias with a stepwise character. Observed steps are believed to be due to magnetization reversals of individual FM layers with varying thicknesses, each of which is pinned through two interfaces from above and below with two AFM layers, except the uppermost FM Co layer with a single AFM neighbor.

Authors:
; ; ; ; ;  [1]
  1. Gebze Institute of Technology, Department of Physics, 41400 Kocaeli (Turkey)
Publication Date:
OSTI Identifier:
22089569
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 112; Journal Issue: 9; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANISOTROPY; ANTIFERROMAGNETIC MATERIALS; ANTIFERROMAGNETISM; ATOMIC FORCE MICROSCOPY; COBALT; COBALT OXIDES; DEPOSITION; EXCHANGE INTERACTIONS; FERROMAGNETIC MATERIALS; FERROMAGNETIC RESONANCE; LAYERS; MAGNETIZATION; MAGNETRONS; POLYCRYSTALS; SUBSTRATES; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; VIBRATING SAMPLE MAGNETOMETERS; X-RAY PHOTOELECTRON SPECTROSCOPY

Citation Formats

Oeztuerk, M., S Latin-Small-Letter-Dotless-I n Latin-Small-Letter-Dotless-I r, E., Demirci, E., Erkovan, M., Oeztuerk, O., and Akdogan, N. Exchange bias properties of [Co/CoO]{sub n} multilayers. United States: N. p., 2012. Web. doi:10.1063/1.4764107.
Oeztuerk, M., S Latin-Small-Letter-Dotless-I n Latin-Small-Letter-Dotless-I r, E., Demirci, E., Erkovan, M., Oeztuerk, O., & Akdogan, N. Exchange bias properties of [Co/CoO]{sub n} multilayers. United States. doi:10.1063/1.4764107.
Oeztuerk, M., S Latin-Small-Letter-Dotless-I n Latin-Small-Letter-Dotless-I r, E., Demirci, E., Erkovan, M., Oeztuerk, O., and Akdogan, N. Thu . "Exchange bias properties of [Co/CoO]{sub n} multilayers". United States. doi:10.1063/1.4764107.
@article{osti_22089569,
title = {Exchange bias properties of [Co/CoO]{sub n} multilayers},
author = {Oeztuerk, M. and S Latin-Small-Letter-Dotless-I n Latin-Small-Letter-Dotless-I r, E. and Demirci, E. and Erkovan, M. and Oeztuerk, O. and Akdogan, N.},
abstractNote = {In this study, the exchange bias properties of four polycrystalline multilayer stack samples of antiferromagnetic (AF) CoO and ferromagnetic (FM) Co in the form of [CoO/Co]{sub n} with n = 1, 2, 3, and 5 are reported. The samples were grown on top of Si (001) substrates by using magnetron sputtering method. X-ray photoelectron spectroscopy (XPS) and transmission electron microscopy (TEM) were used to determine the structural properties of the samples. XPS measurements of cobalt oxide layer revealed the coexistence of different phases in cobalt oxide as CoO and Co{sub 3}O{sub 4}, the latter of which lowers the blocking temperature. The blocking temperature is also affected by the finite size scaling effects observed in AF layers. In-plane ferromagnetic resonance (FMR) measurements revealed uniaxial in-plane magnetic anisotropy for the samples. Low temperature vibrating sample magnetometer measurements provided exchange bias with a stepwise character. Observed steps are believed to be due to magnetization reversals of individual FM layers with varying thicknesses, each of which is pinned through two interfaces from above and below with two AFM layers, except the uppermost FM Co layer with a single AFM neighbor.},
doi = {10.1063/1.4764107},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 9,
volume = 112,
place = {United States},
year = {2012},
month = {11}
}