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Title: Infrared characteristics of VO{sub 2} thin films for smart window and laser protection applications

Abstract

Vanadium dioxide (VO{sub 2}) films with a low semiconductor-to-metal transition temperature of 45 Degree-Sign C were fabricated through direct current magnetron sputtering followed by a post-annealing. Atomic force microscopy measurements show that the VO{sub 2} grain size is about one hundred of nanometers. Infrared (IR) characteristic is well investigated by applying a He-Ne laser power intensity measurement, and the result reveals that the VO{sub 2} film exhibits excellent IR switching property. Furthermore, solar smart window and laser protection experiments demonstrate that the obtained VO{sub 2} thin film is a promising material for the application in related fields.

Authors:
; ; ; ;  [1]
  1. Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074 (China)
Publication Date:
OSTI Identifier:
22089506
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 101; Journal Issue: 19; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANNEALING; ATOMIC FORCE MICROSCOPY; DEPOSITION; DIRECT CURRENT; GRAIN SIZE; HELIUM-NEON LASERS; INFRARED SPECTRA; MAGNETRONS; METALS; PHASE TRANSFORMATIONS; PROTECTIVE COATINGS; SEMICONDUCTOR MATERIALS; SWITCHES; THIN FILMS; TRANSITION TEMPERATURE; VANADIUM OXIDES

Citation Formats

Huang Zhangli, Chen Sihai, Lv Chaohong, Huang Ying, and Lai Jianjun. Infrared characteristics of VO{sub 2} thin films for smart window and laser protection applications. United States: N. p., 2012. Web. doi:10.1063/1.4766287.
Huang Zhangli, Chen Sihai, Lv Chaohong, Huang Ying, & Lai Jianjun. Infrared characteristics of VO{sub 2} thin films for smart window and laser protection applications. United States. doi:10.1063/1.4766287.
Huang Zhangli, Chen Sihai, Lv Chaohong, Huang Ying, and Lai Jianjun. Mon . "Infrared characteristics of VO{sub 2} thin films for smart window and laser protection applications". United States. doi:10.1063/1.4766287.
@article{osti_22089506,
title = {Infrared characteristics of VO{sub 2} thin films for smart window and laser protection applications},
author = {Huang Zhangli and Chen Sihai and Lv Chaohong and Huang Ying and Lai Jianjun},
abstractNote = {Vanadium dioxide (VO{sub 2}) films with a low semiconductor-to-metal transition temperature of 45 Degree-Sign C were fabricated through direct current magnetron sputtering followed by a post-annealing. Atomic force microscopy measurements show that the VO{sub 2} grain size is about one hundred of nanometers. Infrared (IR) characteristic is well investigated by applying a He-Ne laser power intensity measurement, and the result reveals that the VO{sub 2} film exhibits excellent IR switching property. Furthermore, solar smart window and laser protection experiments demonstrate that the obtained VO{sub 2} thin film is a promising material for the application in related fields.},
doi = {10.1063/1.4766287},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 19,
volume = 101,
place = {United States},
year = {2012},
month = {11}
}