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Title: Electronic structure of La{sub 5/3}Sr{sub 1/3}NiO{sub 4} by x-ray emission spectroscopy and resonant inelastic x-ray scattering

Abstract

Here, we report a study of the electronic structure of La{sub 5/3}Sr{sub 1/3}NiO{sub 4} by x-ray emission spectroscopy (XES) and resonant inelastic x-ray scattering (RIXS). The combination of these techniques has permitted us to reveal a complete picture of the occupied and unoccupied states, and to identify various charge transfer transitions appearing as inelastic features in the RIXS spectra. The results add further information on the electronic excitations in this system, and show how the combination of XES and RIXS can be an important experimental tool to address basic physics of complex systems.

Authors:
; ;  [1];  [2];  [3]
  1. European Synchrotron Radiation Facility, BP220, F-38043 Grenoble Cedex (France)
  2. Dipartimento di Fisica, Universita di Roma La Sapienza, P. le Aldo Moro 2, 00185 Roma (Italy)
  3. Laboratoire de Physique de la Matire Condense et Nanostructures (LPMCN), UMR 5586, Universit Lyon I, 69622 Villeurbanne Cedex (France)
Publication Date:
OSTI Identifier:
22089220
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 111; Journal Issue: 11; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CHARGE EXCHANGE; ELECTRONIC STRUCTURE; EMISSION SPECTRA; EMISSION SPECTROSCOPY; EXCITATION; EXCITED STATES; INELASTIC SCATTERING; LANTHANUM COMPOUNDS; NICKELATES; STRONTIUM COMPOUNDS; X RADIATION; X-RAY DIFFRACTION; X-RAY SPECTRA

Citation Formats

Simonelli, L., Huotari, S., Monaco, G., Saini, N. L., and Giordano, V. M. Electronic structure of La{sub 5/3}Sr{sub 1/3}NiO{sub 4} by x-ray emission spectroscopy and resonant inelastic x-ray scattering. United States: N. p., 2012. Web. doi:10.1063/1.4726248.
Simonelli, L., Huotari, S., Monaco, G., Saini, N. L., & Giordano, V. M. Electronic structure of La{sub 5/3}Sr{sub 1/3}NiO{sub 4} by x-ray emission spectroscopy and resonant inelastic x-ray scattering. United States. doi:10.1063/1.4726248.
Simonelli, L., Huotari, S., Monaco, G., Saini, N. L., and Giordano, V. M. Fri . "Electronic structure of La{sub 5/3}Sr{sub 1/3}NiO{sub 4} by x-ray emission spectroscopy and resonant inelastic x-ray scattering". United States. doi:10.1063/1.4726248.
@article{osti_22089220,
title = {Electronic structure of La{sub 5/3}Sr{sub 1/3}NiO{sub 4} by x-ray emission spectroscopy and resonant inelastic x-ray scattering},
author = {Simonelli, L. and Huotari, S. and Monaco, G. and Saini, N. L. and Giordano, V. M.},
abstractNote = {Here, we report a study of the electronic structure of La{sub 5/3}Sr{sub 1/3}NiO{sub 4} by x-ray emission spectroscopy (XES) and resonant inelastic x-ray scattering (RIXS). The combination of these techniques has permitted us to reveal a complete picture of the occupied and unoccupied states, and to identify various charge transfer transitions appearing as inelastic features in the RIXS spectra. The results add further information on the electronic excitations in this system, and show how the combination of XES and RIXS can be an important experimental tool to address basic physics of complex systems.},
doi = {10.1063/1.4726248},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 11,
volume = 111,
place = {United States},
year = {2012},
month = {6}
}