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Title: Characterization of the local crystallinity via reflectance of very slow electrons

Abstract

The reflectance of very slow electrons from solids and its electron energy dependence are shown as characteristic for the crystal system and its spatial orientation so they can serve, e.g., to fingerprinting the orientation of grains in polycrystals. Measurements on single crystals and polycrystals are validated via electron backscatter diffraction analyses. Sensitivity of the method to fine details of crystallinity is demonstrated.

Authors:
; ; ;  [1]
  1. Institute of Scientific Instruments AS CR, Kralovopolska 147, 612 64 Brno (Czech Republic)
Publication Date:
OSTI Identifier:
22080406
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 100; Journal Issue: 26; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BACKSCATTERING; CHANNELING; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ENERGY DEPENDENCE; MICROSTRUCTURE; MONOCRYSTALS; POLYCRYSTALS; REFLECTIVITY; SENSITIVITY; SOLIDS

Citation Formats

Pokorna, Z., Mikmekova, S., Muellerova, I., and Frank, L. Characterization of the local crystallinity via reflectance of very slow electrons. United States: N. p., 2012. Web. doi:10.1063/1.4729879.
Pokorna, Z., Mikmekova, S., Muellerova, I., & Frank, L. Characterization of the local crystallinity via reflectance of very slow electrons. United States. doi:10.1063/1.4729879.
Pokorna, Z., Mikmekova, S., Muellerova, I., and Frank, L. Mon . "Characterization of the local crystallinity via reflectance of very slow electrons". United States. doi:10.1063/1.4729879.
@article{osti_22080406,
title = {Characterization of the local crystallinity via reflectance of very slow electrons},
author = {Pokorna, Z. and Mikmekova, S. and Muellerova, I. and Frank, L.},
abstractNote = {The reflectance of very slow electrons from solids and its electron energy dependence are shown as characteristic for the crystal system and its spatial orientation so they can serve, e.g., to fingerprinting the orientation of grains in polycrystals. Measurements on single crystals and polycrystals are validated via electron backscatter diffraction analyses. Sensitivity of the method to fine details of crystallinity is demonstrated.},
doi = {10.1063/1.4729879},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 26,
volume = 100,
place = {United States},
year = {2012},
month = {6}
}