Characterization of the local crystallinity via reflectance of very slow electrons
- Institute of Scientific Instruments AS CR, Kralovopolska 147, 612 64 Brno (Czech Republic)
The reflectance of very slow electrons from solids and its electron energy dependence are shown as characteristic for the crystal system and its spatial orientation so they can serve, e.g., to fingerprinting the orientation of grains in polycrystals. Measurements on single crystals and polycrystals are validated via electron backscatter diffraction analyses. Sensitivity of the method to fine details of crystallinity is demonstrated.
- OSTI ID:
- 22080406
- Journal Information:
- Applied Physics Letters, Vol. 100, Issue 26; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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