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Title: Single-qubit-gate error below 10{sup -4} in a trapped ion

Abstract

With a {sup 9}Be{sup +} trapped-ion hyperfine-state qubit, we demonstrate an error probability per randomized single-qubit gate of 2.0(2)x10{sup -5}, below the threshold estimate of 10{sup -4} commonly considered sufficient for fault-tolerant quantum computing. The {sup 9}Be{sup +} ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.

Authors:
; ; ; ; ; ; ;  [1]
  1. National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305 (United States)
Publication Date:
OSTI Identifier:
22068607
Resource Type:
Journal Article
Journal Name:
Physical Review. A
Additional Journal Information:
Journal Volume: 84; Journal Issue: 3; Other Information: (c) 2011 American Institute of Physics; Country of input: Syrian Arab Republic; Journal ID: ISSN 1050-2947
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 74 ATOMIC AND MOLECULAR PHYSICS; BERYLLIUM 9; ELECTRODES; ERRORS; IONS; MICROWAVE RADIATION; PROBABILITY; QUANTUM COMPUTERS; SURFACES; TRAPPING; TRAPS

Citation Formats

Brown, K. R., Wilson, A. C., Colombe, Y., Ospelkaus, C., Meier, A. M., Knill, E., Leibfried, D., and Wineland, D. J. Single-qubit-gate error below 10{sup -4} in a trapped ion. United States: N. p., 2011. Web. doi:10.1103/PHYSREVA.84.030303.
Brown, K. R., Wilson, A. C., Colombe, Y., Ospelkaus, C., Meier, A. M., Knill, E., Leibfried, D., & Wineland, D. J. Single-qubit-gate error below 10{sup -4} in a trapped ion. United States. doi:10.1103/PHYSREVA.84.030303.
Brown, K. R., Wilson, A. C., Colombe, Y., Ospelkaus, C., Meier, A. M., Knill, E., Leibfried, D., and Wineland, D. J. Thu . "Single-qubit-gate error below 10{sup -4} in a trapped ion". United States. doi:10.1103/PHYSREVA.84.030303.
@article{osti_22068607,
title = {Single-qubit-gate error below 10{sup -4} in a trapped ion},
author = {Brown, K. R. and Wilson, A. C. and Colombe, Y. and Ospelkaus, C. and Meier, A. M. and Knill, E. and Leibfried, D. and Wineland, D. J.},
abstractNote = {With a {sup 9}Be{sup +} trapped-ion hyperfine-state qubit, we demonstrate an error probability per randomized single-qubit gate of 2.0(2)x10{sup -5}, below the threshold estimate of 10{sup -4} commonly considered sufficient for fault-tolerant quantum computing. The {sup 9}Be{sup +} ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.},
doi = {10.1103/PHYSREVA.84.030303},
journal = {Physical Review. A},
issn = {1050-2947},
number = 3,
volume = 84,
place = {United States},
year = {2011},
month = {9}
}