Electron density measurement of cesium seeded negative ion source by surface wave probe
Abstract
Electron density measurements of a large-scaled negative ion source were carried out with a surface wave probe. By comparison of the electron densities determined with the surface wave probe and a Langmuir probe, it was confirmed that the surface wave probe is highly available for diagnostic of the electron density in H{sup -} ion sources. In addition, it was found that the ratio of the electron density to the H{sup -} ion density dramatically decreases with increase of a bias voltage and the H{sup -} ions become dominant negative particles at the bias voltage of more than 6 V.
- Authors:
-
- National Institute for Fusion Science, Toki 509-5292 (Japan)
- Publication Date:
- OSTI Identifier:
- 22066291
- Resource Type:
- Journal Article
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 83; Journal Issue: 2; Conference: ICIS 2011: 14. international conference on ion sources, Giardini-Naxos, Sicily (Italy), 12-16 Sep 2011; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; CESIUM; COMPARATIVE EVALUATIONS; ELECTRON DENSITY; HYDROGEN IONS 1 MINUS; ION DENSITY; ION SOURCES; LANGMUIR PROBE; PLASMA SURFACE WAVES; WAVE PROPAGATION
Citation Formats
Kisaki, M, Tsumori, K, Nakano, H, Ikeda, K, Osakabe, M, Nagaoka, K, Shibuya, M, Sato, M, Sekiguchi, H, Komada, S, Kondo, T, Hayashi, H, Asano, E, Takeiri, Y, and Kaneko, O. Electron density measurement of cesium seeded negative ion source by surface wave probe. United States: N. p., 2012.
Web. doi:10.1063/1.3671745.
Kisaki, M, Tsumori, K, Nakano, H, Ikeda, K, Osakabe, M, Nagaoka, K, Shibuya, M, Sato, M, Sekiguchi, H, Komada, S, Kondo, T, Hayashi, H, Asano, E, Takeiri, Y, & Kaneko, O. Electron density measurement of cesium seeded negative ion source by surface wave probe. United States. https://doi.org/10.1063/1.3671745
Kisaki, M, Tsumori, K, Nakano, H, Ikeda, K, Osakabe, M, Nagaoka, K, Shibuya, M, Sato, M, Sekiguchi, H, Komada, S, Kondo, T, Hayashi, H, Asano, E, Takeiri, Y, and Kaneko, O. 2012.
"Electron density measurement of cesium seeded negative ion source by surface wave probe". United States. https://doi.org/10.1063/1.3671745.
@article{osti_22066291,
title = {Electron density measurement of cesium seeded negative ion source by surface wave probe},
author = {Kisaki, M and Tsumori, K and Nakano, H and Ikeda, K and Osakabe, M and Nagaoka, K and Shibuya, M and Sato, M and Sekiguchi, H and Komada, S and Kondo, T and Hayashi, H and Asano, E and Takeiri, Y and Kaneko, O},
abstractNote = {Electron density measurements of a large-scaled negative ion source were carried out with a surface wave probe. By comparison of the electron densities determined with the surface wave probe and a Langmuir probe, it was confirmed that the surface wave probe is highly available for diagnostic of the electron density in H{sup -} ion sources. In addition, it was found that the ratio of the electron density to the H{sup -} ion density dramatically decreases with increase of a bias voltage and the H{sup -} ions become dominant negative particles at the bias voltage of more than 6 V.},
doi = {10.1063/1.3671745},
url = {https://www.osti.gov/biblio/22066291},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 2,
volume = 83,
place = {United States},
year = {Wed Feb 15 00:00:00 EST 2012},
month = {Wed Feb 15 00:00:00 EST 2012}
}
Other availability
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.