Measurement of ion and electron temperatures in plasma blobs by using an improved ion sensitive probe system and statistical analysis methods

Okazaki, K; Tanaka, H; Ohno, N; Tsuji, Y; Ezumi, N; Kajita, S

doi:10.1063/1.3681778

Title: Measurement of ion and electron temperatures in plasma blobs by using an improved ion sensitive probe system and statistical analysis methods

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Abstract

We have measured ion temperature as well as electron temperature in plasma blobs observed in a linear plasma device by using an improved ion sensitive probe. Current-voltage characteristics of the ion sensitive probe inside and outside plasma blobs were re-constructed with a conditional sampling method. It is clearly found that both ion and electron temperatures in plasma blobs decrease more slowly in a cross-field direction than those in a bulk plasma without plasma blobs.

Authors:

Okazaki, K; Tanaka, H; Ohno, N; Tsuji, Y ^[1]; Ezumi, N ^[2]; Kajita, S ^[3]

Graduate School of Engineering, Nagoya University, Nagoya, Aichi 464-8603 (Japan)
Nagano National College of Technology, Nagano 381-8550 (Japan)
EcoTopia Science Institute, Nagoya University, Nagoya, Aichi 464-8603 (Japan)

Publication Date:: Wed Feb 15 00:00:00 EST 2012

OSTI Identifier:: 22063791

Resource Type:: Journal Article

Journal Name:: Review of Scientific Instruments

Additional Journal Information:: Journal Volume: 83; Journal Issue: 2; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748

Country of Publication:: United States

Language:: English

Subject:: 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ELECTRIC CONDUCTIVITY; ELECTRON TEMPERATURE; ION PROBES; ION TEMPERATURE; PLASMA; SAMPLING; TEMPERATURE MEASUREMENT

Citation Formats


                    Okazaki, K, Tanaka, H, Ohno, N, Tsuji, Y, Ezumi, N, and Kajita, S. Measurement of ion and electron temperatures in plasma blobs by using an improved ion sensitive probe system and statistical analysis methods.  United States: N. p., 2012. 
        Web.  doi:10.1063/1.3681778.

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                    Okazaki, K, Tanaka, H, Ohno, N, Tsuji, Y, Ezumi, N, & Kajita, S. Measurement of ion and electron temperatures in plasma blobs by using an improved ion sensitive probe system and statistical analysis methods.  United States.  https://doi.org/10.1063/1.3681778

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                    Okazaki, K, Tanaka, H, Ohno, N, Tsuji, Y, Ezumi, N, and Kajita, S. 2012.  
        "Measurement of ion and electron temperatures in plasma blobs by using an improved ion sensitive probe system and statistical analysis methods".  United States.  https://doi.org/10.1063/1.3681778.

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@article{osti_22063791,

  title        = {Measurement of ion and electron temperatures in plasma blobs by using an improved ion sensitive probe system and statistical analysis methods},

  author       = {Okazaki, K and Tanaka, H and Ohno, N and Tsuji, Y and Ezumi, N and Kajita, S},

  abstractNote = {We have measured ion temperature as well as electron temperature in plasma blobs observed in a linear plasma device by using an improved ion sensitive probe. Current-voltage characteristics of the ion sensitive probe inside and outside plasma blobs were re-constructed with a conditional sampling method. It is clearly found that both ion and electron temperatures in plasma blobs decrease more slowly in a cross-field direction than those in a bulk plasma without plasma blobs.},

  doi          = {10.1063/1.3681778},

  url          = {https://www.osti.gov/biblio/22063791},
  journal      = {Review of Scientific Instruments},

  issn         = {0034-6748},

  number       = 2,

  volume       = 83,

  place        = {United States},

  year         = {Wed Feb 15 00:00:00 EST 2012},

  month        = {Wed Feb 15 00:00:00 EST 2012}

}

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