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Title: Prototype cantilevers for quantitative lateral force microscopy

Abstract

Prototype cantilevers are presented that enable quantitative surface force measurements using contact-mode atomic force microscopy (AFM). The ''hammerhead'' cantilevers facilitate precise optical lever system calibrations for cantilever flexure and torsion, enabling quantifiable adhesion measurements and friction measurements by lateral force microscopy (LFM). Critically, a single hammerhead cantilever of known flexural stiffness and probe length dimension can be used to perform both a system calibration as well as surface force measurements in situ, which greatly increases force measurement precision and accuracy. During LFM calibration mode, a hammerhead cantilever allows an optical lever ''torque sensitivity'' to be generated for the quantification of LFM friction forces. Precise calibrations were performed on two different AFM instruments, in which torque sensitivity values were specified with sub-percent relative uncertainty. To examine the potential for accurate lateral force measurements using the prototype cantilevers, finite element analysis predicted measurement errors of a few percent or less, which could be reduced via refinement of calibration methodology or cantilever design. The cantilevers are compatible with commercial AFM instrumentation and can be used for other AFM techniques such as contact imaging and dynamic mode measurements.

Authors:
; ; ;  [1]
  1. Nanomechanical Properties Group, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
Publication Date:
OSTI Identifier:
22063718
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 82; Journal Issue: 9; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ACCURACY; ADHESION; ATOMIC FORCE MICROSCOPY; CALIBRATION; FINITE ELEMENT METHOD; FLEXIBILITY; FRICTION; OPTICAL EQUIPMENT; SENSITIVITY; SURFACE FORCES; TORQUE

Citation Formats

Reitsma, Mark G., Gates, Richard S., Friedman, Lawrence H., and Cook, Robert F. Prototype cantilevers for quantitative lateral force microscopy. United States: N. p., 2011. Web. doi:10.1063/1.3624700.
Reitsma, Mark G., Gates, Richard S., Friedman, Lawrence H., & Cook, Robert F. Prototype cantilevers for quantitative lateral force microscopy. United States. doi:10.1063/1.3624700.
Reitsma, Mark G., Gates, Richard S., Friedman, Lawrence H., and Cook, Robert F. Thu . "Prototype cantilevers for quantitative lateral force microscopy". United States. doi:10.1063/1.3624700.
@article{osti_22063718,
title = {Prototype cantilevers for quantitative lateral force microscopy},
author = {Reitsma, Mark G. and Gates, Richard S. and Friedman, Lawrence H. and Cook, Robert F.},
abstractNote = {Prototype cantilevers are presented that enable quantitative surface force measurements using contact-mode atomic force microscopy (AFM). The ''hammerhead'' cantilevers facilitate precise optical lever system calibrations for cantilever flexure and torsion, enabling quantifiable adhesion measurements and friction measurements by lateral force microscopy (LFM). Critically, a single hammerhead cantilever of known flexural stiffness and probe length dimension can be used to perform both a system calibration as well as surface force measurements in situ, which greatly increases force measurement precision and accuracy. During LFM calibration mode, a hammerhead cantilever allows an optical lever ''torque sensitivity'' to be generated for the quantification of LFM friction forces. Precise calibrations were performed on two different AFM instruments, in which torque sensitivity values were specified with sub-percent relative uncertainty. To examine the potential for accurate lateral force measurements using the prototype cantilevers, finite element analysis predicted measurement errors of a few percent or less, which could be reduced via refinement of calibration methodology or cantilever design. The cantilevers are compatible with commercial AFM instrumentation and can be used for other AFM techniques such as contact imaging and dynamic mode measurements.},
doi = {10.1063/1.3624700},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 9,
volume = 82,
place = {United States},
year = {2011},
month = {9}
}