High resolution, low h{nu} photoelectron spectroscopy with the use of a microwave excited rare gas lamp and ionic crystal filters
- Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531 (Japan)
- Synchrotron Radiation Research Center, Japan Atomic Energy Agency, Hyogo 679-5148 (Japan)
- Institute of Solid State Research-Electronic Properties (IFF-9), Research Center Juelich, Juelich 52425 (Germany)
The need for not only bulk sensitive but also extremely high resolution photoelectron spectroscopy for studying detailed electronic structures of strongly correlated electron systems is growing rapidly. Moreover, easy access to such a capability in one's own laboratory is desirable. Demonstrated here is the performance of a microwave excited rare gas (Xe, Kr, and Ar) lamp combined with ionic crystal filters (sapphire, CaF{sub 2}, and LiF), which can supply three strong lines near the photon energy of hnyu h{nu}=8.4, 10.0, and 11.6 eV, with the h{nu} resolution of better than 600 {mu}eV for photoelectron spectroscopy. Its performance is demonstrated on some materials by means of both angle-integrated and angle-resolved measurements.
- OSTI ID:
- 22058637
- Journal Information:
- Review of Scientific Instruments, Vol. 81, Issue 10; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
Similar Records
Wavelength dependence of the photoelectron angular distributions of the rare gases
Non-dipole effects in photoelectron angular distributions for rare gas atoms
Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ARGON
CALCIUM FLUORIDES
ELECTRON CORRELATION
ELECTRONIC STRUCTURE
EV RANGE
EXCITATION
FILTERS
FLUORESCENT LAMPS
IONIC CRYSTALS
KRYPTON
LITHIUM FLUORIDES
MICROWAVE RADIATION
PHOTOELECTRON SPECTROSCOPY
PHOTONS
RESOLUTION
SAPPHIRE
XENON