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Title: Optimizing the operation of a high resolution vertical Johann spectrometer using a high energy fluorescer x-ray source

Abstract

This paper describes the operation and testing for a vertical Johann spectrometer (VJS) operating in the 13 keV range. The spectrometer is designed to use thin curved mica crystals or thick germanium crystals. The VJS must have a resolution of E/{Delta}E=3000 or better to measure the Doppler broadening of highly ionized krypton and operate at a small x-ray angle in order to be used as a diagnostic in a laser plasma target chamber. The VJS was aligned, tested, and optimized using a fluorescer type high energy x-ray (HEX) source located at National Security Technologies (NSTec), LLC, in Livermore, CA. The HEX uses a 160 kV x-ray tube to excite fluorescence from various targets. Both rubidium and bismuth fluorescers were used for this effort. This presentation describes the NSTec HEX system and the methods used to optimize and characterize the VJS performance.

Authors:
 [1];  [2]
  1. National Security Technologies, LLC, 161 S. Vasco Rd., Suite A, Livermore, California 94550 (United States)
  2. Lawrence Livermore National Laboratory, 7000 East Ave., Livermore, California 94550 (United States)
Publication Date:
OSTI Identifier:
22055903
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 81; Journal Issue: 10; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; BISMUTH; CRYSTALS; DOPPLER BROADENING; FLUORESCENCE; GERMANIUM; KEV RANGE; KRYPTON; LASER-PRODUCED PLASMA; MICA; OPERATION; OPTIMIZATION; RESOLUTION; RUBIDIUM; TARGET CHAMBERS; X RADIATION; X-RAY SOURCES; X-RAY SPECTROMETERS; X-RAY TUBES

Citation Formats

Haugh, Michael, and Stewart, Richard. Optimizing the operation of a high resolution vertical Johann spectrometer using a high energy fluorescer x-ray source. United States: N. p., 2010. Web. doi:10.1063/1.3492421.
Haugh, Michael, & Stewart, Richard. Optimizing the operation of a high resolution vertical Johann spectrometer using a high energy fluorescer x-ray source. United States. https://doi.org/10.1063/1.3492421
Haugh, Michael, and Stewart, Richard. 2010. "Optimizing the operation of a high resolution vertical Johann spectrometer using a high energy fluorescer x-ray source". United States. https://doi.org/10.1063/1.3492421.
@article{osti_22055903,
title = {Optimizing the operation of a high resolution vertical Johann spectrometer using a high energy fluorescer x-ray source},
author = {Haugh, Michael and Stewart, Richard},
abstractNote = {This paper describes the operation and testing for a vertical Johann spectrometer (VJS) operating in the 13 keV range. The spectrometer is designed to use thin curved mica crystals or thick germanium crystals. The VJS must have a resolution of E/{Delta}E=3000 or better to measure the Doppler broadening of highly ionized krypton and operate at a small x-ray angle in order to be used as a diagnostic in a laser plasma target chamber. The VJS was aligned, tested, and optimized using a fluorescer type high energy x-ray (HEX) source located at National Security Technologies (NSTec), LLC, in Livermore, CA. The HEX uses a 160 kV x-ray tube to excite fluorescence from various targets. Both rubidium and bismuth fluorescers were used for this effort. This presentation describes the NSTec HEX system and the methods used to optimize and characterize the VJS performance.},
doi = {10.1063/1.3492421},
url = {https://www.osti.gov/biblio/22055903}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 10,
volume = 81,
place = {United States},
year = {Fri Oct 15 00:00:00 EDT 2010},
month = {Fri Oct 15 00:00:00 EDT 2010}
}