Multiband reflectometry system for density profile measurement with high temporal resolution on JET tokamak

Journal Article · Fri Oct 15 00:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3502329· OSTI ID:22055835

Sirinelli, A; Alper, B; Fessey, J; Hogben, C; Sandford, G; Walsh, M J ^[1]; Bottereau, C; Clairet, F ^[2]; Cupido, L; Meneses, L ^[3]

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1. EURATOM/CCFE Fusion Association, Culham Science Centre, Abingdon, Oxon OX14 3DB (United Kingdom)
2. IRFM, CEA, F-13108 Saint-Paul-lez-Durance (France)
3. Instituto de Plasmas e FuSao Nuclear, Instituto Superior Tecnico, Associacao EURATOM/IST, Av. Rovisco Pais, 1049-001 Lisbon (Portugal)

A new system has been installed on the JET tokamak consisting of six independent fast-sweeping reflectometers covering four bands between 44 and 150 GHz and using orthogonal polarizations. It has been designed to measure density profiles from the plasma edge to the center, launching microwaves through 40 m of oversized corrugated waveguides. It has routinely produced density profiles with a maximum repetition rate of one profile every 15 {mu}s and up to 100 000 profiles per pulse.

• OSTI ID: 22055835
• Journal Information: Review of Scientific Instruments, Vol. 81, Issue 10; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
JET TOKAMAK
MICROWAVE RADIATION
PLASMA DENSITY
PLASMA DIAGNOSTICS
POLARIZATION
REFLECTION
TIME RESOLUTION
WAVEGUIDES