A tangentially viewing fast ion D-alpha diagnostic for NSTX

Bortolon, A; Heidbrink, W W; Podesta, M

doi:10.1063/1.3495768

Title: A tangentially viewing fast ion D-alpha diagnostic for NSTX

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Abstract

A second fast ion D-alpha (FIDA) installation is planned at NSTX to complement the present perpendicular viewing FIDA diagnostics. Following the present diagnostic scheme, the new diagnostic will consist of two instruments: a spectroscopic diagnostic that measures fast ion spectra and profiles at 16 radial points with 5-10 ms resolution and a system that uses a band pass filter and photomultiplier to measure changes in FIDA light with 50 kHz sampling rate. The new pair of FIDA instruments will view the heating beams tangentially. The viewing geometry minimizes spectral contamination by beam emission or edge sources of background emission. The improved velocity-space resolution will provide detailed information about neutral-beam current drive and about fast ion acceleration and transport by injected radio frequency waves and plasma instabilities.

Authors:

Bortolon, A; Heidbrink, W W ^[1]; Podesta, M ^[2]

University of California, Irvine, California 92697 (United States)
Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States)

Publication Date:: Fri Oct 15 00:00:00 EDT 2010

OSTI Identifier:: 22055807

Resource Type:: Journal Article

Journal Name:: Review of Scientific Instruments

Additional Journal Information:: Journal Volume: 81; Journal Issue: 10; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748

Country of Publication:: United States

Language:: English

Subject:: 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BEAM CURRENTS; BEAMS; EMISSION; ION SPECTROSCOPY; IONS; KHZ RANGE; NSTX DEVICE; PLASMA DIAGNOSTICS; PLASMA HEATING; PLASMA INSTABILITY; RADIOWAVE RADIATION; VISIBLE RADIATION

Citation Formats


                    Bortolon, A, Heidbrink, W W, and Podesta, M. A tangentially viewing fast ion D-alpha diagnostic for NSTX.  United States: N. p., 2010. 
        Web.  doi:10.1063/1.3495768.

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                    Bortolon, A, Heidbrink, W W, & Podesta, M. A tangentially viewing fast ion D-alpha diagnostic for NSTX.  United States.  https://doi.org/10.1063/1.3495768

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                    Bortolon, A, Heidbrink, W W, and Podesta, M. 2010.  
        "A tangentially viewing fast ion D-alpha diagnostic for NSTX".  United States.  https://doi.org/10.1063/1.3495768.

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@article{osti_22055807,

  title        = {A tangentially viewing fast ion D-alpha diagnostic for NSTX},

  author       = {Bortolon, A and Heidbrink, W W and Podesta, M},

  abstractNote = {A second fast ion D-alpha (FIDA) installation is planned at NSTX to complement the present perpendicular viewing FIDA diagnostics. Following the present diagnostic scheme, the new diagnostic will consist of two instruments: a spectroscopic diagnostic that measures fast ion spectra and profiles at 16 radial points with 5-10 ms resolution and a system that uses a band pass filter and photomultiplier to measure changes in FIDA light with 50 kHz sampling rate. The new pair of FIDA instruments will view the heating beams tangentially. The viewing geometry minimizes spectral contamination by beam emission or edge sources of background emission. The improved velocity-space resolution will provide detailed information about neutral-beam current drive and about fast ion acceleration and transport by injected radio frequency waves and plasma instabilities.},

  doi          = {10.1063/1.3495768},

  url          = {https://www.osti.gov/biblio/22055807},
  journal      = {Review of Scientific Instruments},

  issn         = {0034-6748},

  number       = 10,

  volume       = 81,

  place        = {United States},

  year         = {Fri Oct 15 00:00:00 EDT 2010},

  month        = {Fri Oct 15 00:00:00 EDT 2010}

}

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