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Title: Precision structural diagnostics of layered superconductor/ferromagnet nanosystems V/Fe by reflectometry and diffuse scattering of synchrotron radiation

Journal Article · · Crystallography Reports
; ;  [1]; ; ; ;  [2]; ;  [3]
  1. National Research Center Kurchatov Institute (Russian Federation)
  2. Hungarian Academy of Sciences, KFKI Research Institute for Particle and Nuclear Physics (Hungary)
  3. Moscow State University (Russian Federation)

Layered superconducting ferromagnetic nanosystems Cu(32 nm)/V(40-80 nm)/Fe(0.5-4 nm)/MgO(001) have been investigated by reflectometry and the diffuse scattering of synchrotron radiation. The data obtained make it possible to determine the important characteristics of samples such as the layer thickness and the rms heights and lateral correlation lengths of roughness at the interfaces.

OSTI ID:
22054259
Journal Information:
Crystallography Reports, Vol. 56, Issue 5; Other Information: Copyright (c) 2011 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7745
Country of Publication:
United States
Language:
English