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Title: Investigation of the formation of quasicrystalline Al{sub 70}-Pd{sub 20}-Re{sub 10} phase in situ during annealing

Abstract

The change in the phase composition of thin-film layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al{sub 3}Pd phase is formed at a temperature above 260 Degree-Sign C, which transforms into the AlPd phase at 580 Degree-Sign C, and the icosahedral quasicrystalline Al-Pd-Re phase is formed at 680 Degree-Sign C.

Authors:
; ;  [1]; ;  [2];  [1]
  1. Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)
  2. Russian Research Center Kurchatov Institute (Russian Federation)
Publication Date:
OSTI Identifier:
22054258
Resource Type:
Journal Article
Journal Name:
Crystallography Reports
Additional Journal Information:
Journal Volume: 56; Journal Issue: 5; Other Information: Copyright (c) 2011 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7745
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ALUMINIUM ALLOYS; ANNEALING; LAYERS; NANOSTRUCTURES; PALLADIUM ALLOYS; RHENIUM ALLOYS; TEMPERATURE RANGE 0400-1000 K; THIN FILMS

Citation Formats

Makhotkin, I. A., Yakunin, S. N., Seregin, A. Yu., E-mail: seregin.a83@gmail.com, Shaitura, D. S., Tsetlin, M. B., and Tereshchenko, E. Yu. Investigation of the formation of quasicrystalline Al{sub 70}-Pd{sub 20}-Re{sub 10} phase in situ during annealing. United States: N. p., 2011. Web. doi:10.1134/S106377451105018X.
Makhotkin, I. A., Yakunin, S. N., Seregin, A. Yu., E-mail: seregin.a83@gmail.com, Shaitura, D. S., Tsetlin, M. B., & Tereshchenko, E. Yu. Investigation of the formation of quasicrystalline Al{sub 70}-Pd{sub 20}-Re{sub 10} phase in situ during annealing. United States. doi:10.1134/S106377451105018X.
Makhotkin, I. A., Yakunin, S. N., Seregin, A. Yu., E-mail: seregin.a83@gmail.com, Shaitura, D. S., Tsetlin, M. B., and Tereshchenko, E. Yu. Thu . "Investigation of the formation of quasicrystalline Al{sub 70}-Pd{sub 20}-Re{sub 10} phase in situ during annealing". United States. doi:10.1134/S106377451105018X.
@article{osti_22054258,
title = {Investigation of the formation of quasicrystalline Al{sub 70}-Pd{sub 20}-Re{sub 10} phase in situ during annealing},
author = {Makhotkin, I. A. and Yakunin, S. N. and Seregin, A. Yu., E-mail: seregin.a83@gmail.com and Shaitura, D. S. and Tsetlin, M. B. and Tereshchenko, E. Yu.},
abstractNote = {The change in the phase composition of thin-film layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al{sub 3}Pd phase is formed at a temperature above 260 Degree-Sign C, which transforms into the AlPd phase at 580 Degree-Sign C, and the icosahedral quasicrystalline Al-Pd-Re phase is formed at 680 Degree-Sign C.},
doi = {10.1134/S106377451105018X},
journal = {Crystallography Reports},
issn = {1063-7745},
number = 5,
volume = 56,
place = {United States},
year = {2011},
month = {9}
}