Setup for optimized grazing incidence x-ray absorption experiments on thin films on substrates

Journal Article · Mon Jun 15 00:00:00 EDT 2009 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3155791· OSTI ID:22053588

Maurizio, C; Rovezzi, M; Bardelli, F; Pais, H G; D'Acapito, F ^[1]

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1. CNR-INFM-OGG c/o ESRF, GILDA CRG 6, Rue Jules Horowitz, F-38043 Grenoble (France)

We present a state-of-the-art experimental apparatus and a proper setup to perform x-ray absorption spectroscopy (XAS) experiments in grazing incidence mode. This geometry is appropriate for doped thin films or interfaces buried at moderate depth in a thick matrix, whenever the scattering and/or fluorescence from the matrix has to be strongly attenuated. Both the calculation and the experimental data demonstrate that the specific setup that consists in a grazing incidence and grazing collection geometry is extremely advantageous. In fact, with respect to the standard geometry used to perform XAS experiments in fluorescence mode, the present setup allows an enhancement in the interesting fluorescence signal from the surface layer without a corresponding increase in the elastic scattering contribution from the matrix. The sample holder especially designed for this kind of experiment can work in vacuum and at low temperature. An easy and quick automatic sample alignment procedure is detailed.

• OSTI ID: 22053588
• Journal Information: Review of Scientific Instruments, Vol. 80, Issue 6; Other Information: (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION SPECTROSCOPY
ALIGNMENT
DOPED MATERIALS
ELASTIC SCATTERING
EXPERIMENTAL DATA
FLUORESCENCE
GEOMETRY
INCIDENCE ANGLE
MATRIX MATERIALS
SAMPLE HOLDERS
SURFACES
TEMPERATURE RANGE 0065-0273 K
THIN FILMS
X RADIATION
X-RAY SPECTROSCOPY