Test system for charge collection efficiency measurement (SYCOC) for neutron irradiated silicon sensors
- Universite Catholique de Louvain, Louvain-la-Neuve (Belgium)
One of the constraints in using standard Float Zone silicon layer as base material for tracking in particle physics is its radiation hardness. The detection efficiency is degraded by the introduction of defects in the silicon crystal and charge trapping becomes the main problem. The Charge Collection Efficiency (CCE) is a relevant parameter in order to determine the detection performance of such devices. A state-of-the-art test system named 'Systeme de mesure de collection de charge' (SYCOC) has been developed for the characterization of diode and microstrip silicon sensors before and after irradiation. The system is designed to perform Charge Collection Efficiency (CCE) and Transient Current Technique (TCT) measurements with laser and radioactive sources in a controlled environment. Initial measurements on diodes are presented. (authors)
- OSTI ID:
- 22039918
- Resource Relation:
- Conference: ANIMMA 2011: 2. International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications, Ghent (Belgium), 6-9 Jun 2011; Other Information: Country of input: France; 4 refs.; IEEE Catalog Number: CFP1124I-CDR
- Country of Publication:
- United States
- Language:
- English
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