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Title: Phase transitions in thin Ge{sub 2}Sb{sub 2}Te{sub 5} chalcogenide films according to Raman spectroscopy data

Journal Article · · Semiconductors
; ;  [1];  [2];  [3]
  1. Ryazan State Radio Engineering University (Russian Federation)
  2. Russian Academy of Sciences, Kurnakov Institute of General and Inorganic Chemistry (Russian Federation)
  3. Russian Academy of Sciences, Ioffe Physical-Technical Institute (Russian Federation)

Data on the Raman spectra of thin Ge{sub 2}Sb{sub 2}Te{sub 5} chalcogenide semiconductor films are reported. The study is performed with the purpose of determining the temperatures of phase transitions initiated by laser radiation.

OSTI ID:
22038989
Journal Information:
Semiconductors, Vol. 46, Issue 5; Other Information: Copyright (c) 2012 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7826
Country of Publication:
United States
Language:
English