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Title: Application of transmission electron microscopy for microstructural characterization of perfluoropentacene thin films

Abstract

The crystalline structure and orientation of perfluoropentacene (C{sub 22}F{sub 14}, PFP) fibers formed upon thin-film deposition onto SiO{sub 2} substrates have been studied by means of transmission electron microscopy (TEM), atomic force microscopy (AFM), and x-ray diffraction. The synopsis of TEM micrographs and diffraction patterns enhances the understanding of local crystal orientation on small length scales. The relationship of the PFP fiber morphology with the crystalline arrangement of PFP molecules within single fibers was established using this technique. Radiation damage, which is a critical problem for TEM investigations of organic materials, is described and the sample morphology after TEM investigations is correlated with AFM measurements of samples previously examined by TEM.

Authors:
; ; ; ; ;  [1]
  1. Faculty of Physics and Materials Science Center, Philipps-University Marburg, D-35032 Marburg (Germany)
Publication Date:
OSTI Identifier:
22038729
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 110; Journal Issue: 7; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTALS; ELECTRIC CONDUCTIVITY; FIBERS; IRRADIATION; MICROSTRUCTURE; MORPHOLOGY; ORGANIC MATTER; ORGANIC SEMICONDUCTORS; RADIATION EFFECTS; SILICON OXIDES; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION

Citation Formats

Haas, Benedikt, Beyer, Andreas, Witte, Wiebke, Breuer, Tobias, Witte, Gregor, and Volz, Kerstin. Application of transmission electron microscopy for microstructural characterization of perfluoropentacene thin films. United States: N. p., 2011. Web. doi:10.1063/1.3646549.
Haas, Benedikt, Beyer, Andreas, Witte, Wiebke, Breuer, Tobias, Witte, Gregor, & Volz, Kerstin. Application of transmission electron microscopy for microstructural characterization of perfluoropentacene thin films. United States. doi:10.1063/1.3646549.
Haas, Benedikt, Beyer, Andreas, Witte, Wiebke, Breuer, Tobias, Witte, Gregor, and Volz, Kerstin. Sat . "Application of transmission electron microscopy for microstructural characterization of perfluoropentacene thin films". United States. doi:10.1063/1.3646549.
@article{osti_22038729,
title = {Application of transmission electron microscopy for microstructural characterization of perfluoropentacene thin films},
author = {Haas, Benedikt and Beyer, Andreas and Witte, Wiebke and Breuer, Tobias and Witte, Gregor and Volz, Kerstin},
abstractNote = {The crystalline structure and orientation of perfluoropentacene (C{sub 22}F{sub 14}, PFP) fibers formed upon thin-film deposition onto SiO{sub 2} substrates have been studied by means of transmission electron microscopy (TEM), atomic force microscopy (AFM), and x-ray diffraction. The synopsis of TEM micrographs and diffraction patterns enhances the understanding of local crystal orientation on small length scales. The relationship of the PFP fiber morphology with the crystalline arrangement of PFP molecules within single fibers was established using this technique. Radiation damage, which is a critical problem for TEM investigations of organic materials, is described and the sample morphology after TEM investigations is correlated with AFM measurements of samples previously examined by TEM.},
doi = {10.1063/1.3646549},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 7,
volume = 110,
place = {United States},
year = {2011},
month = {10}
}