skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Modifications of local structures of Gd{sub 2}O{sub 3} on incorporation of SiO{sub 2}

Abstract

In the present work we have reported the results of investigations on local structures of e-beam evaporated (Gd{sub 2}O{sub 3}-SiO{sub 2}) composite thin films by synchrotron based EXAFS measurements. The evolution of local structure in the case of the Gd{sub 2}O{sub 3}-SiO{sub 2} system is found to be different from the HfO{sub 2}-SiO{sub 2} system reported by us earlier. The EXAFS analysis has shown that the Gd-O bond length decreases monotonically as SiO{sub 2} content in the films increases. Also the amplitudes of the peaks in the FT-EXAFS spectra of the samples, which depend jointly on the coordination numbers as well as the Debye-Waller factors (measure of disorder) are found to decrease monotonically with increase in SiO{sub 2} contents in the Gd{sub 2}O{sub 3} matrix. Atomic force microscopy (AFM) measurements of the samples also show continuous evolution of amorphous-like denser microstructure with increase in SiO{sub 2} content in the films. Hence incorporation of SiO{sub 2} in the Gd{sub 2}O{sub 3} matrix, results in a continuous change in oxygen coordination yielding a change in the Gd-O bond length and also results in a continuous increase in amorphousness and a smoother morphology of the samples and, unlike the HfO{sub 2}-SiO{sub 2} system,more » does not show any maximum for a particular SiO{sub 2} concentration.« less

Authors:
; ; ;  [1];  [2]; ;  [3]; ; ;  [4]
  1. Applied Spectroscopy Division, Bhabha Atomic Research Centre, Trombay, Mumbai 400085 (India)
  2. Coolant Systems Laboratory, Raja Ramanna Centre for Advanced Technology, Indore 452013 (India)
  3. Surface Physics Division, Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Kolkata 700064 (India)
  4. National Synchrotron Radiation Research Center, 101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu 30076, Taiwan (China)
Publication Date:
OSTI Identifier:
22038706
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 110; Journal Issue: 6; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; BOND LENGTHS; COMPOSITE MATERIALS; CRYSTAL STRUCTURE; DEBYE-WALLER FACTOR; DIELECTRIC MATERIALS; ELECTRON BEAMS; FINE STRUCTURE; GADOLINIUM OXIDES; HAFNIUM OXIDES; MATRIX MATERIALS; MICROSTRUCTURE; MORPHOLOGY; SILICON OXIDES; THIN FILMS; VACUUM COATING; X-RAY SPECTROSCOPY

Citation Formats

Das, N. C., Sahoo, N. K., Bhattacharyya, D., Thakur, S., Nanda, D., Hazra, S., Bal, J. K., Lee, J. F., Tai, Y. L., and Hsieh, C. A. Modifications of local structures of Gd{sub 2}O{sub 3} on incorporation of SiO{sub 2}. United States: N. p., 2011. Web. doi:10.1063/1.3642083.
Das, N. C., Sahoo, N. K., Bhattacharyya, D., Thakur, S., Nanda, D., Hazra, S., Bal, J. K., Lee, J. F., Tai, Y. L., & Hsieh, C. A. Modifications of local structures of Gd{sub 2}O{sub 3} on incorporation of SiO{sub 2}. United States. doi:10.1063/1.3642083.
Das, N. C., Sahoo, N. K., Bhattacharyya, D., Thakur, S., Nanda, D., Hazra, S., Bal, J. K., Lee, J. F., Tai, Y. L., and Hsieh, C. A. Thu . "Modifications of local structures of Gd{sub 2}O{sub 3} on incorporation of SiO{sub 2}". United States. doi:10.1063/1.3642083.
@article{osti_22038706,
title = {Modifications of local structures of Gd{sub 2}O{sub 3} on incorporation of SiO{sub 2}},
author = {Das, N. C. and Sahoo, N. K. and Bhattacharyya, D. and Thakur, S. and Nanda, D. and Hazra, S. and Bal, J. K. and Lee, J. F. and Tai, Y. L. and Hsieh, C. A.},
abstractNote = {In the present work we have reported the results of investigations on local structures of e-beam evaporated (Gd{sub 2}O{sub 3}-SiO{sub 2}) composite thin films by synchrotron based EXAFS measurements. The evolution of local structure in the case of the Gd{sub 2}O{sub 3}-SiO{sub 2} system is found to be different from the HfO{sub 2}-SiO{sub 2} system reported by us earlier. The EXAFS analysis has shown that the Gd-O bond length decreases monotonically as SiO{sub 2} content in the films increases. Also the amplitudes of the peaks in the FT-EXAFS spectra of the samples, which depend jointly on the coordination numbers as well as the Debye-Waller factors (measure of disorder) are found to decrease monotonically with increase in SiO{sub 2} contents in the Gd{sub 2}O{sub 3} matrix. Atomic force microscopy (AFM) measurements of the samples also show continuous evolution of amorphous-like denser microstructure with increase in SiO{sub 2} content in the films. Hence incorporation of SiO{sub 2} in the Gd{sub 2}O{sub 3} matrix, results in a continuous change in oxygen coordination yielding a change in the Gd-O bond length and also results in a continuous increase in amorphousness and a smoother morphology of the samples and, unlike the HfO{sub 2}-SiO{sub 2} system, does not show any maximum for a particular SiO{sub 2} concentration.},
doi = {10.1063/1.3642083},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 6,
volume = 110,
place = {United States},
year = {2011},
month = {9}
}