Low emissivity Ag/Ta/glass multilayer thin films deposited by sputtering

Journal Article · Thu Sep 15 00:00:00 EDT 2011 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3636107· OSTI ID:22038703

Park, Sun Ho ^[1]; Lee, Kee Sun ^[1]; Sivasankar Reddy, A ^[2]

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1. Division of Advanced Materials Engineering, Kongju National University, Budaedong, Cheonan City (Korea, Republic of)
2. Green Home Energy Technology Center, Cheonan City (Korea, Republic of)

Ta is deposited on a glass substrate as an interlayer for the two-dimensional growth of Ag thin films because Ta has good thermal stability and can induce a negative surface-energy change in Ag/glass. From the transmission electron microscopy results, we concluded that the Ag crystals in the bottom layer (seemingly on Ag/Ta) were flattened; this was rarely observed in the three-dimensional growth mode. Comparing Ag/Ta/glass with Ag/glass, we found that the Ta interlayer was effective in reducing both the resistance and the emissivity, accompanied by the relatively high transmittance in the visible region. In particular, Ag(9 nm)/Ta(1 nm)/glass film showed 0.08 of the emissivity, including {approx}61% of the transmittance in the visible region (wavelength: 550 nm).

• OSTI ID: 22038703
• Journal Information: Journal of Applied Physics, Vol. 110, Issue 6; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTAL GROWTH
CRYSTALS
DEPOSITION
ELECTRIC CONDUCTIVITY
EMISSIVITY
GLASS
INTERFACES
LAYERS
LIGHT TRANSMISSION
SILVER
SPUTTERING
SUBSTRATES
SURFACE ENERGY
TANTALUM
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
VISIBLE SPECTRA